期刊


ISSN0020-2940
刊名Measurement + Control
参考译名计量与控制
收藏年代1998～2024



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2024

2024, vol.57, no.1 2024, vol.57, no.2 2024, vol.57, no.3 2024, vol.57, no.4 2024, vol.57, no.5 2024, vol.57, no.6
2024, vol.57, no.7

题名作者出版年年卷期
Mask wearing detection algorithm based on improved YOLOv7Ming Li; Weixiong Zhang; Zhiliang Zhang; Fang Luo; Yin Zhang; Lunhui Xu20242024, vol.57, no.6
A fast-response active disturbance rejection control for a class of nonlinear uncertain systemsWei Wei; Bowen Duan; Weicun Zhang; Min Zuo20242024, vol.57, no.6
Optimal design of Luenberger reduced-order observer with low sensitivity for linear multivariable systemsFu-I Chou20242024, vol.57, no.6
Tillage depth regulation system via depth measurement feedback and composite sliding mode control: A field comparison validation studyAnzhe Wang; Xin Ji; Yongyun Zhu; Qingzhuang Wang; Xinhua Wei; Shaocen Zhang20242024, vol.57, no.6
A coaxial multi-ring detection method for measuring the pitch and thickness accuracy of cylindrical gearsDehai Zhang; Junheng Li; Yanqin Li; Chao Wu; Tao Wang; Zhicheng Zhang; Xin Yin; Hongshuai Hu20242024, vol.57, no.6
Automatic tracking and intelligent observation of tidal bore propagation velocity based on UAV and computer visionXiujuan Zhang; Guangjie Zhan; Tao Ding; He Jiang; Yaqin Wang; Yi Zhang; Li Liu20242024, vol.57, no.6
Fixed time containment control of multi-agent system under multi-source mismatched disturbanceCheng Xiang; He Jing; Zhang Changfan; Hu Xinliang; Zhang Miaoying20242024, vol.57, no.6
A novel method for measuring the width and angle of corrosion in Hall thrusters using three-dimensional point cloudZhi-Feng Zhou; Lie-Quan Wu; Chong-Yang Wang20242024, vol.57, no.6
Recognition to weightlifting postures using convolutional neural networks with evaluation mechanismQuantao He; Wenjuan Li; Wenquan Tang; Baoguan Xu20242024, vol.57, no.6
Control theory for skewed distribution under operation side of the telecommunication industry and hard-bake process in the semiconductor manufacturing processAzam Zaka; Riffat Jabeen; Mashhood Ahmad; Hassan M Aljohani; Maha M Helmi20242024, vol.57, no.6
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