期刊


ISSN0968-4328
刊名Micron
参考译名微米
收藏年代2002～2025



全部

2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023 2024 2025

2024, vol.176 2024, vol.177 2024, vol.178 2024, vol.179 2024, vol.180 2024, vol.181
2024, vol.182 2024, vol.183 2024, vol.184 2024, vol.185 2024, vol.186 2024, vol.187

题名作者出版年年卷期
Micrometer insights into Nepeta genus: Pollen micromorphology unveiledJabeen, Shaista; Zafar, Muhammad; Ahmad, Mushtaq; Ali, M. Ajmal; Elshikh, Mohamed S.; Makhkamov, Trobjon; Mamarakhimov, Oybek; Yuldashev, Akramjon; Khaydarov, Khislat; Gafforov, Yusufjon; Baysunov, Babir; Mammadova, Afat O.; Botirova, Laziza; Sultana, Shazia; Majeed, Salman; Rozina; Ahmad, Shabir; Abid, Aqsa; Rahmatov, Abdurashid20242024, vol.177
Surface morphology and microstructure of Bauhinia variegata L. flowers and leavesXu, Yan20242024, vol.177
Effect of resveratrol on SH-SY5Y cells studied by atomic force microscopyYuan, Jiayao; Wang, Zuobin; Dong, Jianjun; Gao, Mingyan; Yang, Fan; Sun, Hao20242024, vol.177
Voxel dose-limited resolution for thick beam-sensitive specimens imaged in a TEM or STEMEgerton, R. F.20242024, vol.177
Exit wave function reconstruction from two defocus images using neural networkMeng, Ziyi; Ming, Wenquan; He, Yutao; Shen, Ruohan; Chen, Jianghua20242024, vol.177
Sample thickness affects contrast and measured shape in TEM images and in electron tomogramsHayashida, Misa; Yamasaki, Jun; Malac, Marek20242024, vol.177
Optimized procedure for conventional TEM sample preparation using birefringenceBrozyniak, Aleksander; Stadlmann, Karin; Kuernsteiner, Philipp; Groiss, Heiko20242024, vol.177
AB-PLS-DA: Pansharpening tailored for scanning electron microscopy and energy-dispersive X-ray spectrometry multimodal fusionDuma, Zina-Sabrina; Reinikainen, Satu-Pia; Sihvonen, Tuomas20242024, vol.177
Achieving an improved performance in double-sided friction stir weld joints by adjusting the welding conditions during the passes of AA6061-T6 aluminium alloyThakur, Ankit; Sharma, Varun; Minhas, Navdeep; Verma, Rajeev20242024, vol.177
Rapid scanning method for SICM based on autoencoder networkWu, Wenlin; Liao, Xiaobo; Wang, Lei; Chen, Siyu; Zhuang, Jian; Zheng, Qiangqiang20242024, vol.177
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