期刊


ISSN0968-4328
刊名Micron
参考译名微米
收藏年代2002~2025



全部

2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023 2024 2025

2024, vol.176 2024, vol.177 2024, vol.178 2024, vol.179 2024, vol.180 2024, vol.181
2024, vol.182 2024, vol.183 2024, vol.184 2024, vol.185 2024, vol.186 2024, vol.187

题名作者出版年年卷期
Insight into structural and chemical profile / composition of powdered enamel and dentine in different types of permanent human teethSarna-Bos, Katarzyna; Boguta, Patrycja; Szymanska-Chargot, Monika; Skic, Kamil; Zdunek, Artur; Stachurski, Piotr; Vodanovic, Marin; Las, Renata Cha20242024, vol.179
Novel technology for controlled fabrication of aperture cantilever sensors for scanning near-field optical microscopyKolomiytsev, A. S.; Kotosonova, A. V.; Il in, O. I.; Saenko, A. V.; Shelaev, A. V.; Baryshev, A. V.20242024, vol.179
Localization and quantitative distribution of a chromatin structural protein Topoisomerase II on plant chromosome using HVTEM and UHVTEMSartsanga, Channarong; Phengchat, Rinyaporn; Wako, Toshiyuki; Fukui, Kiichi; Ohmido, Nobuko20242024, vol.179
A review of recent advancement in covalent organic framework (COFs) synthesis and characterization with a focus on their applications in antibacterial activityAl-dolaimy, F.; Saraswat, Shelesh Krishna; Hussein, Baydaa Abed; Hussein, Uday Abdul-Reda; Saeed, Shakir Mahmood; Kareem, Ashwaq Talib; Abdulwahid, Alzahraa S.; Mizal, Thair L.; Muzammil, Khursheed; Alawadi, Ahmed Hussien; Alsalamy, Ali; Hussin, Farah; Kzarb, Mazin Hadi20242024, vol.179
Measuring electrical properties in semiconductor devices by pixelated STEM and off-axis electron holography (or convergent beams vs. plane waves).Cooper, David; Bruas, Lucas; Bryan, Matthew; Boureau, Victor20242024, vol.179