期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2026



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024 2025 2026

2026, vol.28, no.1

题名作者出版年年卷期
GUEST EDITORIAL: THREE DECADES AT ISTFA: A JOURNEY OF LEARNING AND NETWORKINGIngrid De Wolf20262026, vol.28, no.1
A STEP TOWARD AUTOMATION IN FAILURE ANALYSIS BY FIB-SEM 3D TOMOGRAPHY AND AI SEGMENTATIONPascal Limbecker; Rong Wu; Thomas Woyack; Heiko Stegmann; Daniel Plencner; Roland Salzer20262026, vol.28, no.1
IRPS 2026anonymous20262026, vol.28, no.1
FIB SEM MEETING 2026anonymous20262026, vol.28, no.1
ADVANCED SEMICONDUCTOR FAILURE ANALYSIS USING IN-SITU AFM IN FIB-SEMRadek Dao; Ondrej Novotny; Veronika Hegrova; Rosalinda Ring; Jan Neuman20262026, vol.28, no.1
ENHANCING SOFT DEFECT LOCALIZATION WITH SOFTWARE AUTOMATED INTELLIGENT LASER SCANNING (SAILS) AND ARRAY-BASED IMAGE RECONSTRUCTIONArun Karunanithi; Benny Hsu; Kent Erington; Joseph Caroselli; Winston Gao; Calder Wilson; Aaron Liao20262026, vol.28, no.1
ISTFA 2025 AND THE NEXT ERA OF FAILURE ANALYSISRenee S. Parente20262026, vol.28, no.1
A SUMMARY OF THE ISTFA 2025 PANEL DISCUSSION: SCALING BEYOND MOORE'S LAW: HETEROGENEOUS COMPUTING AND ADVANCED PACKAGINGWentao Qin; Greg Johnson20262026, vol.28, no.1
ISTFA 2025 USER GROUP HIGHLIGHTSAnita Madan; Cecile S. Bonifacio; Jayant D'Souza20262026, vol.28, no.1
ISTFA 2025 FOCUSED ION BEAM (FIB) USER GROUPValerie Brogden; Steve Herschbein; Michael Wong; Edward Principe20262026, vol.28, no.1
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