会议文集


文集名Precision Interferometric Metrology - ASPE 2015 Summer Topical Meeting
会议名5th ASPE Topical Meeting on Precision Interferometric Metrology
中译名《第五届美国精密工程学会精度干涉测量会议》
机构American Society for Precision Engineering (ASPE)
会议日期July 8-10, 2015
会议地点Golden, Colorado, USA
出版年2015
馆藏号319334


题名作者出版年
DEVELOPMENTS IN PRECISION INTERFEROMETRYKlaus Freischlad2015
Figure measurement of high-aspect-ratio optics by stitchingWilliam P. Kuhn; Robert E. Parks; Mourad Idir; Lei Huang2015
INTERFEROMETRIC MEASUREMENT OF LARGE SPHERE RADII USING HOLOGRAMSUlf Griesmann; Quandou Wang; Johannes A. Soons; Kate Medicus2015
ASPHERE MEASUREMENTS BY CGH - A PARTIAL UNCERTAINTY ANALYSISKate Medicus; Patrick Augino; Greg Frisch2015
Comb Calibrated FMCW LADAR for Ranging and Surface MappingE. Baumann; F. R. Giorgetta; J. D. Deschenes; W. C. Swann; I. Coddington; N. R. Newbury2015
Super-localized swept wavelength interferometric ranging using frequency estimation methodsMartha I. Bodine; Robert R. McLeod2015
SINUSOIDAL FREQUENCY MODULATION ON LASER DIODE FOR ITS FREQUENCY STABILIZATION AND DISPLACEMENT MEASURING INTERFEROMETRYMasato AKETAGAWA; Tung T. VU; R. Yamazaki2015
Why Are We Using Step Height Standards to Calibrate Interferometers?Peter J. de Groot2015
Interferometric Metrology for Precision Engineering - a Report From the Front LinesJack R. Clark2015
IN-SITU DEFECT DETECTION SYSTEMS FOR R2R FLEXIBLE PV BARRIER FILMSF. Gao; H. Muhamedsalih; D. Tang; M. Elrawemi; L. Blunt; X. Jiang; S. Edge; D. Bird; P. Hollis2015
EXTENDING THE VERTICAL RANGE OF WAVELENGTH SCANNING INTERFEROMETRYGiuseppe Moschetti; Hussam Muhamedsalih; Xiangqian Jiang; Richard K. Leach; Daniel O'Connor2015
MEMS OPTOMECHANICAL ACCELEROMETRY STANDARDSFelipe Guzman Cervantes; Yiliang Bao; Jason J. Gorman; John R. Lawall; Jacob M. Taylor; Thomas W. LeBrun2015
AN UPGRADED DATA ACQUISITION AND DRIVE SYSTEM AT THE NANOMETER COMPARATORP. Kochert; R. Koning; C. Weichert; J. Flugge; E. Manske2015
INTEGRATION OF FABRY-PEROT INTERFEROMETRY WITH A NEW CALCULABLE CAPACITORYinan Yu; Yicheng Wang; Jon R. Pratt2015
The NIST watt balance, the new SI, and canonical ideas of precisionJon R. Pratt2015
OPTOMECHANICAL MOTION SENSORSFelipe Guzman Cervantes; Oliver Gerberding; John Melcher; Julian Stirling; Jon R. Pratt; Gordon A. Shaw; Jacob M. Taylor2015
CLEARING THE FOG FOR BEST IN THE WORLD AIR-WAVELENGTHPatrick Egan; Jack Stone2015
ABSOLUTE REFRACTIVE INDEX SENSING AND TRACKING BASED ON VARIABLE LENGTH VACUUM CELLXiangzhi Yu; Tieli Zhang; Jonathan D. Ellis2015
CHALLENGES IN LITHOGRAPHY METROLOGY FROM A ZEISS PERSPECTIVEFrank Riepenhausen2015
EXPERIMENTALLY INVESTIGATE THE ALIGNMENT AND BEAM ABERRATION EFFECTS ON INTERFEROMETRIC DIFFERENTIAL WAVEFRONT SENSINGXiangzhi Yu; Jonathan D. Ellis2015
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