制造业外文文献服务平台 | foreigndata.cmes.org

会议文集

ISBN	1-887706-38-0
文集名	Precision Interferometric Metrology
会议名	ASPE Summer Topical Meeting
中译名	《美国精密工程学会夏季主题会议：精度干涉测量法的计量学》
机构	American Society for Precision Engineering (ASPE)
会议日期	July 20-22, 2005
会议地点	Middletown, Connecticut, USA
出版年	2005
馆藏号	284333

题名	作者	出版年
Displacement Laser Interferometry with Sub-nanometer Uncertainty	Cosijns, S. J. A. G.; Haitjema, H.; Schellekens, P. H. J.	2005
Real-time periodic error correction: experiment and data analysis	Tony L. Schmitz; Lonnie Houck III; David Chu; Lee Kalem	2005
Synchronous Acoustooptic Tuning of Free Space External Cavity Lasers for Homodyne Chirp Interferometry	Geraint Owen; William R. Trutna, Jr.	2005
Deflectometry Rivals Interferometry	Gerd Hausler	2005
Application of Phase Retrieval to Precision Optical Metrology	Brady, G. R.; Fienup, J. R.	2005
The Heterodyne Profiler Redux	Paul R. Parise	2005
Enhancing Measurement Accuracy with Subaperture Stitching Interferometry	Murphy, P. E.; DeVries, G.; O'Donohue, S.	2005
GAUSSIAN BEAM MODELING OF THE RADIUS OF CURVATURE	Kate M. Medicus; James Snyder; Angela D. Davies	2005
Interferometric Measurement of Sphere Diameter	Krishnakanth Desiraju; Robert J. Hocken	2005
Optoelectronic Digital Holographic Methodologies for Shape and Deformation Measurements	Furlong-Vazquez, C.	2005
SOPHISTICATED LIGHT SWITCHES	J. Liesener; L. Seifert; M. Reicherter	2005
Tomographic methods to characterize three-dimensional refractive index inhomogeneities	Jochen Kauffmann; Norbert Kerwien; Hans J. Tiziani; Wolfgang Osten	2005
SUPER OBLIQUE INCIDENCE INTERFEROMETER USING SWS PRISM	Yukitoshi OTANI; Yasuhiro MIZUTANI; Norihiro UMEDA	2005
Interferometric Thickness Calibration of 300 mm Silicon Wafers	Quandou Wang; Ulf Griesmann; Robert Polvani	2005
MODELLING OF OPTICAL IMAGE TRANSFORMATIONS BY MEANS OF 4×4 MATRICES	Piotr J. Meyer; Jan van Eijk	2005