会议文集


会议名25th Annual Meeting of The American Society for Precision Engineering
中译名《第二十五届美国精密工程学会年度会议》
机构American Society for Precision Engineering (ASPE)
会议日期October 31 - November 4, 2010
会议地点Atlanta, Georgia, USA
出版年2010
馆藏号302658


题名作者出版年
DOUBLE SIDED INTERFEROMETER, PROFILING MEASUREMENT SIMULTANEOUSLY YIELDS THICKNESS AND FORMRichard M. Seugling; Michael J. Wilson; Pete J. Davis; Shawn C. Peterson; James Hamilton2010
METHODS, PRACTICES, AND STANDARDS FOR EVALUATING ON-MACHINE TOUCH TRIGGER PROBING OF WORKPIECESRonnie R. Fesperman; Shawn P. Moylan; M. Alkan Donmez2010
AN ESTIMATION METHOD FOR FIVE DEGREE FREEDOM ERROR MOTIONS OF THE PRECISION SPINDLEJooho Hwang; Jongyoup Shim; Chun-Hong Park2010
INCREASES IN CORROSION RESISTANCE AND WATER REPELLENCY OF METAL MOLD SURFACE BY EB POLISHINGAkira OKADA; Yoshiyuki UNO; Kensuke UEMURA2010
NEW METHOD FOR DETERMINATION OF VOLUMETRIC POSITIONING ERRORBa Chinh Bui; Jooho Hwang; Chan-Hong Lee; Chun-Hong Park2010
POSITIONING REPEATABILITY EVALUATION OF HYDROSTATIC BEARING GUIDED PRECISION MACHINEJongyoup Shim; Chinh B. Bui; Jooho Hwang; Chang-Kyu Song; Chun-Hong Park2010
VIBRATION ATTENUATION IN OPTICAL PITCHMohammad Mainuddin; Brigid A. Mullany2010
MANUFACTURING PROCESS ERROR SIGNATURE AND CMM UNCERTAINTY COSTSDarek Ceglarek; Giovanni Moroni; Stefano Petro2010
ELECTROMAGNETIC-FORCE-DRIVING TYPE MEMS SWITCH USING HIGH PERFORMANCE NdFeB/Ta THIN FILM PERMANENT MAGNETMasato Ishibashi; Ryo Tanabe; Tadahiko Shinshi; Minoru Uehara2010
DIRECT, HIGH-SPEED MILLING OF POLYMER MICROCHAMBER ARRAYSChristopher R. Phaneuf; Craig R. Forest2010
NON-LITHOGRAPHIC FABRICATION OF CARBON NANOTUBE-BASED SENSORS FOR SMALL-SCALE FORCE AND DISPLACEMENT SENSINGMichael Cullinan; Robert Panas; Cody Daniel; Martin L. Culpepper2010
DESIGN AND CHARACTERIZATION OF A 6 DEGREE-OF-FREEDOM MESO-SCALE NANOPOSITIONER WITH INTEGRATED STRAIN SENSINGChristopher M. DiBiasio; Martin L. Culpepper2010
WEAKLY COPPER-FULLERENOL LAYER ON CHEMICAL MECHANICAL POLISHING USING WATER SOLUBLE FULLERENOLHirotaka Kishida; Yasuhiro Takaya; Terutake Hayashi; Masaki Michihata; Ken Kokubo2010
INVESTIGATIONS OF METROLOGICAL MODELS FOR THE NANOMEASURING AND NANOPOSITIONING MACHINE WITH RESPECT TO THE MEASUREMENT UNCERTAINTY BY MEANS OF A MONTE CARLO SIMULATIONPhilipp Kreutzer; Roland Fussl; Eberhard Manske; Nataliya Dorozhovets2010
GRINDING OF MICROSTRUCTURES IN BRITTLE MATERIALS WITH MULTIPLE MICROPROFILED GRINDING WHEELSDenkena, B.; Kohler, J.; Kastner, J.; Hahmann, D.2010
MEASUREMENTS USING THE HIGH ACCURACY ATOMIC FORCE MICROSCOPE AND THE SUB-ATOMIC MEASURING MACHINEJerald L. Overcash; Robert J. Hocken; Darya Amin-Shahidi; David L. Trumper; Mark L. Schattenburg2010
MODULATION OF ELECTROMAGNETIC RADIATION USING A DOT MATRIX PRINTERNikita Pak; Christopher R. Phaneuf; Suhasa B. Kodandaramaiah; Craig R. Forest2010
DESIGN AND PERFORMANCE OF TELESCOPING MICROPIPETTE ARRAYS FOR HIGH THROUGHPUT IN VIVO PATCH CLAMPINGSuhasa B. Kodandaramaiah; Saifullah Malik; Mike J. Dergance; Edward S. Boyden; Craig R. Forest2010
COMPARING DIFFERENT COOLING CONCEPTS FOR BALL SCREW SYSTEMSJosef Mayr; Markus Ess; Sascha Weikert; Konrad Wegener2010
PARAMETRIC MODELING OF SELF-WEIGHTED DISTORTION FOR PLANE OPTICAL MIRRORSWon Hyun Park; Brian Cuerden; Sug-Whan Kim; James H. Burge2010
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