会议文集


会议名ASPE 2013 Annual Meeting
中译名《第二十八届美国精密工程学会年度会议》
机构American Society for Precision Engineering (ASPE)
会议日期October 20-25, 2013
会议地点St. Paul, Minnesota, USA
出版年2013
馆藏号311072


题名作者出版年
ADDRESSING BIG CHALLENGES WITH PRECISION SYMBIOTIC SYSTEMS THINKINGAlexander H. Slocum2013
DEVELOPMENT OF HYBRID NANO-STEREOLITHOGRAPHY SYSTEM USING EVANESCENT LIGHT AND PROPAGATING LIGHT FOR HIGH THROUGHPUT FABRICATIONKodai Miyakawa; Ryo Matsuzawa; Satoru Takahashi; Kiyoshi Takamasu2013
MICRO-LASER ASSISTED SINGLE POINT DIAMOND TURNING FEASIBILITY TESTS OF SINGLE CRYSTAL SILICONDeepak Ravindra; John Patten2013
FULLY-AUTOMATED IN VIVO SINGLE CELL ELECTROPHYSIOLOGYJamison Go; Aaron Fan; Coby Lu; Suhasa Kodandaramaiah; Gregory L. Hoist; William Stoy; Ilya Kolb; Edward S. Boyden; Craig R. Forest2013
DIRECTION BASED FILTERING OF FLEXIBLE MODEST. Groothuijsen; J. Eisinger; R. Hoogendijk; D. Laro; J. van Eijk; M. Steinbuch2013
FRICTION MODELING AND COMPENSATION USING FREQUENCY DOMAIN PARAMETERIZATION BY DAHL RESONANCEJun Young Yoon; David L. Trumper2013
SOMETHING FOR (ALMOST) NOTHING: X-ray Microscope Performance Enhancement Through Control Architecture ChangeSheikh T. Mashrafi; Curt Preissner; Srinivasa Salapaka; Huyue Zhao2013
REDUCTION OF RESIDUAL VIBRATION OF PIEZOELECTRIC ACTUATOR DRIVEN BY CURRENT PULSEKatsushi Furutani; Atsushi Sakata2013
OPTIMAL DAMPING FOR THE REDUCTION OF RESIDUAL VIBRATIONS IN ULTRA-PRECISION MANUFACTURING MACHINESJihyun Lee; Chinedum E. Okwudire2013
PRECISION HIGH NUMERICAL APERTURE SCANNING SYSTEM FOR FEMTOSECOND MICROMACHINING OF OPHTHALMIC MATERIALS OVER LARGE FIELDDaniel R. Brooks; Nicolas S. Brown; Lisen Xu; Daniel E. Savage; Wayne H. Knox; Jonathan D. Ellis2013
High Volume Manufacturing of Large Segmented Telescope MirrorsUlrich Mueller2013
Visual Inspection of Cosmetic and Functional Defects in a Manufacturing EnvironmentChristopher M. Cilip; Daniel S. Pratt; Marcin B. Bauza2013
ON THE USE OF MERCURY SESSILE DROPS AS REFERENCE ARTEFACTS FOR THE CALIBRATION OF OPTICAL SURFACE TOPOGRAPHY MEASURING INSTRUMENTSJacob W. Chesna; Yuki Shimizu; Richard K. Leach2013
PROGRESS ON NON-CONTACT FLATTENING OF GLASSEdward Sung; Brandon Chalifoux; Mark Schattenburg; Ralf Heilmann2013
THE TILTED-WAVE-INTERFEROMETER (TWI): A QUICK AND FLEXIBLE APPROACH TO MEASURE ASPHERIC AND FREE-FORM SURFACESGoran B. Baer; Johannes Schindler; Christof Pruss; Wolfgang Osten2013
IN-SITU TESTING OF A FREEFORM OPTIC WITH A CHROMATIC CONFOCAL SENSORRalf Steinkopf; Susanne Zwick; Andreas Gebhardt; Stefan Risse; Ramona Eberhardt2013
ROUND-ROBIN MEASUREMENTS OF A TOROIDAL WINDOWKate Medicus; Scott DeFisher; Marcin Bauza; Paul Dumas2013
High dynamics range enhancement in digital fringe projection techniqueGelareh Babaie; Mehrdad Abolbashari; Faramarz Farahi2013
PRECISION SHAPING OF THIN MIRROR SUBSTRATES FOR X-RAY TELESCOPES USING ION IMPLANTATIONBrandon D. Chalifoux; Edward Sung; Ralf K. Heilmann; Mark L. Schattenburg2013
LONG-TERM STABILITY OF A MOVING-SCALE MEASUREMENT SYSTEM WITH NANOMETER UNCERTAINTYNiels Bosmans; Jun Qian; Dominiek Reynaerts2013
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