会议文集


会议名2023 ASPE Winter Topical Meeting: Precision Optical Metrology Workshop
中译名《2023年美国精密工程学会冬季专题会议》
机构American Society for Precision Engineering (ASPE)
会议日期6-7 March 2023
会议地点Tucson, Arizona, USA
出版年2023
馆藏号346844


题名作者出版年
Characterization of Environmental Error Contribution to Laser Interferometry through Statistical AnalysisJason Lennert2023
EVALUATION OF OSAM-1 CAMERA FOCUS SHIFT IN A SIMULATED ORBITAL PRESSURE ENVIRONMENTKevin H. Miller; Sarah E. Eckert; Stephen Cheney2023
Optical Metrology for Precision Acceleration DetectionAdam Hines; Andrea Nelson; Yanqi Zhang; Guillermo Valdes; Jose Sanjuan; Felipe Guzman2023
OPTICAL METROLOGY FOR SYNCHROTRON MIRRORS AT NSLS-IILei Huang; Tianyi Wang; Mourad Idir2023
HIGH-PRECISION OPTICAL METROLOGY FOR THE GEOMETRIC VERIFICATION OF PRESS-FIT ZONESKerstin Zangl; Reinhard Danzl; Michael Kreil; Franz Helmli2023
SURFACE FIGURE METROLOGY BASED ON GEOMETRIC PHASE COMPONENTSHyo Mi Park; Hyo Bin Jeong; Young-Sik Ghim; Daewook Kim; Charlotte E. Guthery; Ki-Nam Joo2023
AUTOMATIC CLOSED- LOOP ULTRAFAST LASER STRESS FIGURING USING ON-MACHINE DIFFERENTIAL DEFLECTOMETRYMarcos A. Esparza; Kevin A. Laverty; Brandon D. Chalifoux; Daewook Kim2023
On how to better design no-null surface figure interferometers around the size of array detector pixelsMartin Tangari Larrategui; Thomas G. Brown; Jonathan D. Ellis2023
Binary pseudo-random test standards for characterization of various metrology instruments over high to low spatial frequenciesKeiko Munechika; Weilun Chao; Raymond Conley; Scott Dhuey; Ulf Griesmann; Ian Lacey; Carlos Pina-Hernandez; Simon Rochester; Peter Takacs; Kaito Yamada; Valeriy V. Yashchuk2023
Common Mistakes in MTF MeasurementsStephen D. Fantone2023
SAMPLING ERRORS FROM RELAY MAGNIFICATION IN MODULATION TRANSFER FUNCTION (MTF) MEASUREMENTPatrick McKenna2023
Why Measure MTF?Stephen D. Fantone2023
IS THE MTF AN ERROR PLOT?Peter de Groot; Xavier Colonna de Lega2023
METRICS FOR THE ANALYSIS OF OPTICAL INSTRUMENTS PERFOMANCEJose Sanjuan2023
THE PTB MULTIWAVELENGTH INTERFEROMETER FOR DISTANCES UP TO 5000 mPaul Kochert; Tobias Meyer; Hongdan Yan; Anni Sauthoff; Gunther Prellinger; Florian Pollinger2023
PHYSICAL RAY TRACING WITH BESSEL BEAMSRobert E. Parks; Daewook Kim2023
TECHNICAL NOISE SUPPRESSION VIA WEIGHTED QUADRATURE DETECTIONSteven R. Gillmer; Julian Martinez-Rincon; Jonathan D. Ellis2023
Permanent tracebility of a Nanopositioning and Nanomeasuring MachineE. Manske; U. Blumroder; P. Kochert; T. Frohlich; T. Kissinger; I. Ortlepp; U. Gerhardt; R. Mastylov2023



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