期刊


ISSN1350-2387
刊名IEE Proceedings
参考译名英国电气工程师学会论文集：计算机与数字技术
收藏年代1999～2006

关联期刊参考译名收藏年代
IET Computers & Digital TechniquesIET计算机与数字技术2007～2012


全部

1999 2000 2001 2002 2003 2004
2005 2006

2004, vol.151, no.1 2004, vol.151, no.2 2004, vol.151, no.3 2004, vol.151, no.4 2004, vol.151, no.5 2004, vol.151, no.6

题名作者出版年年卷期
Low-power system-on-chip architecture for wireless LANsL. Bisdounis; C. Dre; S. Blionas; D. Metafas; A. Tatsaki; F. leromnimon; E. Macii; P. Rouzet; R. Zafalon; L. Benini20042004, vol.151, no.1
Simultaneous routing and buffering in SOC floorplan designJ. P. Fang; Y.-S. Tong; S. J. Chen20042004, vol.151, no.1
Architectural probing: a new paradigm for enabling communication refinement in SOC designC. He; M. Lajolo; M. Jacome20042004, vol.151, no.1
Energy-efficient Java execution using local memory and object co-locationS. Kim; S. Tomar; N. Vijaykrishnan; M. Kandemir; M. J. Irwin20042004, vol.151, no.1
dMT: inexpensive throughput enhancement in small-scale embedded microprocessors with differential multithreadingK. R. Hirst; J. W. Haskins; K. Skadron20042004, vol.151, no.1
Data-adaptive motion estimation algorithm and VLSI architecture design for low-power video systemsS. Saponara; L. Fanucci20042004, vol.151, no.1
Finite state machine state assignment targeting low power consumptionS. Chattopadhyay; P. N. Reddy20042004, vol.151, no.1
Formal verification of a SONET data stream processorS. Tahar; M. H. Zobair; X. Song20042004, vol.151, no.1
Testing of stuck-open faults in generalised Reed-Muller and EXOR sum-of-products CMOS circuitsH. Rahaman; D. K. Das; B. B. Bhattacharya20042004, vol.151, no.1



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