期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



全部

2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023

2020, vol.49, no.1 2020, vol.49, no.2 2020, vol.49, no.3 2020, vol.49, no.4 2020, vol.49, no.5 2020, vol.49, no.6
2020, vol.49, no.7 2020, vol.49, no.8

题名作者出版年年卷期
Spectrophotometric Monitoring of Chloride Electrolyte for the Electrochemical Deposition of PermalloyR. D. Tikhonov; S. A. Polomoshnov; D. V. Kostuk20202020, vol.49, no.7
Thermal Activation of Getters in Magnetron Production TechnologyA. A. Polunina; V. S. Petrov; I. F. Khanbekov; I. P. Li; A. I. Gaidar; D. N. Loktev20202020, vol.49, no.7
Determination of the Operating Time to Failure of a Sub-100-nm MOS Transistor Gate Dielectric Using Accelerated TestsA. S. Sivchenko; E. V. Kuznetsov; A. N. Saurov20202020, vol.49, no.7
Thermal Stabilization of the Geometric Parameters of an Array of Silver Nanoparticles Obtained by Vacuum-Thermal Evaporation on an Unheated SubstrateD. G. Gromov; S. V. Dubkov; G. S. Eritsyan; A. I. Savitsky; V. A. Bykov; Yu. A. Bobrov20202020, vol.49, no.7
Thermomechanical Strength of Element Connections in Microelectronic ModulesA. I. Pogalov; A. Yu. Titov; S. P. Timoshenkov20202020, vol.49, no.7
Determining the Junction-to-Case Thermal Resistance of a Semiconductor Device from Its Cooling CurveN. L. Evdokimova; V. V. Dolgov; K. A. Ivanov20202020, vol.49, no.7
The Special Features of Simulation of the Current-Voltage Characteristics of JFETs in the Cryogenic Temperature RangeK. O. Petrosyants; M. R. Ismail-Zade; L. M. Sambursky20202020, vol.49, no.7
Charge Properties of the MOS Transistor Structure with the Channel Made from a Two-Dimensional CrystalT. I. Makovskaya; A. L. Danilyuk; A. V. Krivosheeva; V. L. Shaposhnikov; V. E. Borisenko20202020, vol.49, no.7
Active Processor Hardware StackA. A. Semenov; D. A. Usanov; A. S. Dronkin20202020, vol.49, no.7
Study of SOI Field-Effect Hall Sensors in the Partial Depletion ModeM. A. Korolev; V. N. Mordkovich; A. V. Leonov; S. S. Devlikanova20202020, vol.49, no.7
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