期刊


ISSN0018-9219
刊名Proceedings of the IEEE
参考译名电气与电子工程师学会会报
收藏年代1998～2013



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2000, vol.88, no.1 2000, vol.88, no.10 2000, vol.88, no.11 2000, vol.88, no.12 2000, vol.88, no.2 2000, vol.88, no.3
2000, vol.88, no.4 2000, vol.88, no.5 2000, vol.88, no.6 2000, vol.88, no.7 2000, vol.88, no.8 2000, vol.88, no.9
2000, vol.89, no.1

题名作者出版年年卷期
Failure analysis of integrated circuits beyond the diffraction limit: contact mode near-field scanning optical microscopy with integrated resistance, capacitance, and UV confocal imagingAaron Lewis; Efim Shambrot; Anna Radko; Klony Lieberman; Solomon Ezekiel; Dimitry Veinger; Gila Yampolski20002000, vol.88, no.9
Imaging with solid immersion lenses, spatial resolution, and applicationsQiang Wu; Luke P. Ghislain; V. B. Elings20002000, vol.88, no.9
Interactive cellular and cordless video telephony: state-of-the-art system design principles and expected performanceLajos Hanzo; Peter Cherriman; Ee-Lin Kuan20002000, vol.88, no.9
Nanofabrication and atom manipulation by optical near-field and relevant quantum optical theoryMotoichi Ohtsu; Kiyoshi Kobayashi; Haruhiko Ito; Geun-Hyoung Lee20002000, vol.88, no.9
Near-field optics: a new tool for data storageTom D. Milster20002000, vol.88, no.9
Semiconductor characterization and analytical technologyThomas J. Shaffner20002000, vol.88, no.9
Theoretical and experimental study of the forces between different SNOM probes and chemically treated AFM cantileversMaria-Pilar Bernal; Fabienne Marquis-Weible; Pierre-Yves Boillat; Patrick Lambelet20002000, vol.88, no.9
Time-resolved optical characterization of electrical activity in integrated circuitsJames C. Tsang; Jeffrey Alan Kash; David P. Vallett20002000, vol.88, no.9



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