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期刊
ISSN
0018-9219
刊名
Proceedings of the IEEE
参考译名
电气与电子工程师学会会报
收藏年代
1998~2013
全部
1998
1999
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2003, vol.91, no.1
2003, vol.91, no.10
2003, vol.91, no.11
2003, vol.91, no.12
2003, vol.91, no.2
2003, vol.91, no.3
2003, vol.91, no.4
2003, vol.91, no.5
2003, vol.91, no.6
2003, vol.91, no.7
2003, vol.91, no.8
2003, vol.91, no.9
题名
作者
出版年
年卷期
Introduction to flash memory
Roberto Bez; Emilio Camerlenghi; Alberto Modelli; Angelo Visconti
2003
2003, vol.91, no.4
Survey on flash technology with specific attention to the critical process parameters related to manufacturing
Giancarlo Ginami; Danilo Canali; Davide Fattori; Giuliana Girardi; Petronilla Scintu; Laura Tarchini; Domenica Tricarico
2003
2003, vol.91, no.4
An overview of flash architectural developments
Giovanni Campardo; Marco Scotti; Salvatrice Scommegna; Sebastiano Pollara; Andrea Silvagni
2003
2003, vol.91, no.4
The flash memory read path: building blocks and critical aspects
Rino Micheloni; Luca Crippa; Miriam Sangalli; Giovanni Campardo
2003
2003, vol.91, no.4
High-voltage management in single-supply CHE NOR-type flash memories
Ilaria Motta; Giancarlo Ragone; Osama Khouri; Guido Torelli; Rino Micheloni
2003
2003, vol.91, no.4
An overview of logic architectures inside flash memory devices
Andrea Silvagni; Giuseppe Fusillo; Roberto Ravasio; Massimiliano Picca; Stefano Zanardi
2003
2003, vol.91, no.4
Current criticalities and innovation perspectives in flash memory design automation
Armando Conci; Anna Faldarini; Gaspare Fumagalli; Antonio Girardi; Marcello Pesare; Nicola Tecli; Massimo Zucchinali
2003
2003, vol.91, no.4
Program schemes for multilevel flash memories
Marco Grossi; Massimo Lanzoni; Bruno Ricco
2003
2003, vol.91, no.4
On-chip error correcting techniques for new-generation flash memories
Stefano Gregori; Alessandro Cabrini; Osama Khouri; Guido Torelli
2003
2003, vol.91, no.4
Overerase phenomena: an insight into flash memory reliability
Andrea Chimenton; Paolo Pellati; Piero Olivo
2003
2003, vol.91, no.4
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