期刊


ISSN0018-9219
刊名Proceedings of the IEEE
参考译名电气与电子工程师学会会报
收藏年代1998～2013



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2010, vol.98, no.1 2010, vol.98, no.10 2010, vol.98, no.11 2010, vol.98, no.12 2010, vol.98, no.2 2010, vol.98, no.3
2010, vol.98, no.4 2010, vol.98, no.5 2010, vol.98, no.6 2010, vol.98, no.7 2010, vol.98, no.8 2010, vol.98, no.9

题名作者出版年年卷期
POINT OF VIEW: Vehicular Communications: Ubiquitous Networks for Sustainable MobilityERIK STROM; HANNES HARTENSTEIN; PAOLO SANTI; WERNER WIESBECK20102010, vol.98, no.7
SCANNING THE ISSUE: Challenges and Opportunities in GaN and ZnO Devices and MaterialsHADIS MORKOC; JEN-INN CHYI; ALOIS KROST; YASUSHI NANISHI; DONALD J. SILVERSMITH20102010, vol.98, no.7
Ultrafast Removal of LO-Mode Heat From a GaN-Based Two-Dimensional ChannelARVYDAS MATULIONIS; JUOZAPAS LIBERIS; ILONA MATULIONIENE; MINDAUGAS RAMONAS; EMILIS SERMUKSNIS20102010, vol.98, no.7
Status of Reliability of GaN-Based Heterojunction Field Effect TransistorsJACOB H. LEACH; HADIS MORKOC20102010, vol.98, no.7
Small Signal Equivalent Circuit Modeling for AlGaN/GaN HFET: Hybrid Extraction Method for Determining Circuit Elements of AlGaN/GaN HFETQIAN FAN; JACOB H. LEACH; HADIS MORKOC20102010, vol.98, no.7
GaN Power Transistors on Si Substrates for Switching ApplicationsNARIAKI IKEDA; YUKI NIIYAMA; HIROSHI KAMBAYASHI; YOSHIHIRO SATO; TAKEHIKO NOMURA; SADAHIRO KATO; SEIKOH YOSHIDA20102010, vol.98, no.7
Solid-State Lighting: An Integrated Human Factors, Technology, and Economic PerspectiveJEFFREY Y. TSAO; MICHAEL E. COLTRIN; MARY H. CRAWFORD; JERRY A. SIMMONS20102010, vol.98, no.7
GaN-Based Light-Emitting Diodes: Efficiency at High Injection LevelsUMIT OZGUR; HUIYONG LIU; XING LI; XIANFENG NI; HADIS MORKOC20102010, vol.98, no.7
High Brightness GaN Vertical Light-Emitting Diodes on Metal Alloy for General Lighting ApplicationCHEN-FU CHU; CHAO-CHEN CHENG; WEN-HUAN LIU; JIUNN-YI CHU; FENG-HSU FAN; HAO-CHUN CHENG; TRUNG DOAN; CHUONG ANH TRAN20102010, vol.98, no.7
Structural Defects and Degradation Phenomena in High-Power Pure-Blue InGaN-Based Laser DiodesSHIGETAKA TOMIYA; OSAMU GOTO; MASAO IKEDA20102010, vol.98, no.7
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