期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002~2023



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2005, vol.34, no.1 2005, vol.34, no.2 2005, vol.34, no.3 2005, vol.34, no.4 2005, vol.34, no.5 2005, vol.34, no.6

题名作者出版年年卷期
Noncontact Temperature Measurement on Dielectrics and Semiconductors: Part 2V. K. Bitukov; V. A. Petrov20052005, vol.34, no.1
Short-Circuited Double Langmuir Probe as a Model of a Conducting Wafer under Plasma ProcessingA. F. Aleksandrov; V. A. Riaby; V. P. Savinov; V. G. Yakunin20052005, vol.34, no.1
Parts Screening for ESD SusceptibilityM. I. Gorlov; V. A. Emel'yanov; I. I. Rubtsevich; D. Yu. Smirnov20052005, vol.34, no.1
MBE Growth of Silicon Films on Diamond SubstratesV. Y. Karasev; V. D. Kryukov; M. G. Kuznetsov; S. M. Pintus; M. A. Lamin; O. P. Pchelyakov; L. V. Sokolov20052005, vol.34, no.1
Defect Formation in Epitaxial GaP Junctions under Heat TreatmentS. V. Boulyrskii; N. S. Groushko; D. V. Kazakov20052005, vol.34, no.1
Combined Effect of V{sub}2O{sub}5 and NH{sub}3 on Thermal Oxidation of InPI. Ya. Mittova; S. S. Lavrushina; M. V. Sycheva20052005, vol.34, no.1
Magnetic Nanostructures and Nanodevices with a Semiconductor or Dielectric SpacerS. I. Kasatkin; A. M. Murav'jev; N. V. Plotnikova; F. A. Pudonin; L. A. Azhaeva; Z. N. Sergeeva; V. D. Khodzhaev20052005, vol.34, no.1
MOS Integrated Piezoresistive MicrosensorsV. P. Dragunov20052005, vol.34, no.1
Microprocessor Structure in Relation to On-Chip Interconnection CharacteristicsG. V. Kristovskii; Yu. I. Terent'ev20052005, vol.34, no.1