期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007


题名作者出版年年卷期
A 0.26-μm{sup}2 U-Shaped Nitride-Based Programming Cell on Pure 90-nm CMOS TechnologyHan-Chao Lai; Kai-Yuan Cheng; Ya-Chin King; Chrong-Jung Lin20072007, vol.28, no.9
Substrate Bias Effect Linked to Parasitic Series Resistance in Multiple-Gate SOI MOSFETsTamara Rudenko; Valeria Kilchytska; Nadine Collaert; Malgorzata Jurczak; Alexey Nazarov; Denis Flandre20072007, vol.28, no.9
CMOS Dual-Work-Function Engineering by Using Implanted Ni-FUSIChien-Ting Lin; Manfred Ramin; Michael Pas; Rick Wise; Yean-Kuen Fang; Che-Hua Hsu; Yao-Tsung Huang; Li-Wei Cheng; Mike Ma20072007, vol.28, no.9
Profiling of Nitride-Trap-Energy Distribution in SONOS Flash Memory by Using a Variable-Amplitude Low-Frequency Charge-Pumping TechniqueYi-Ying Liao; Sheng-Fu Horng; Yao-Wen Chang; Tao-Cheng Lu; Kuang-Chao Chen; Tahui Wang; Chin-Yuan Lu20072007, vol.28, no.9
High Mobility Strained Ge pMOSFETs With High-κ/Metal GateGareth Nicholas; T. J. Grasby; D. J. F. Fulgoni; C. S. Beer; J. Parsons; M. Meuris; M. M. Heyns20072007, vol.28, no.9
Valence Band Offset Measurements on Thin Silicon-on-Insulator MOSFETsJ. L. P. J. van der Steen; R. J. E. Hueting; G. D. J. Smit; T. Hoang; J. Holleman; J. Schmitz20072007, vol.28, no.9
Measurement of Channel Stress Using Gate Direct Tunneling Current in Uniaxially Stressed nMOSFETsChen-Yu Hsieh; Ming-Jer Chen20072007, vol.28, no.9
PMOSFET Reliability Study for Direct Silicon Bond (DSB) Hybrid Orientation Technology (HOT)Yao-Tsung Huang; Angelo Pinto; Chien-Ting Lin; Che-Hua Hsu; Manfred Ramin; Mike Seacrist; Mike Ries; Kenneth Matthews; Billy Nguyen; Melissa Freeman; Bruce Wilks; Chuck Stager; Charlene Johnson; Laurie Denning; Joe Bennett; Sachin Joshi20072007, vol.28, no.9
Gate Voltage Dependence of MOSFET 1/f Noise StatisticsMete Erturk; Tian Xia; William F. Clark20072007, vol.28, no.9
A Novel Nanowire Channel Poly-Si TFT Functioning as Transistor and Nonvolatile SONOS MemoryShih-Ching Chen; Ting-Chang Chang; Po-Tsun Liu; Yung-Chun Wu; Po-Shun Lin; Bae-Heng Tseng; Jang-Hung Shy; S. M. Sze; Chun-Yen Chang; Chen-Hsin Lien20072007, vol.28, no.9
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