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期刊
ISSN
8756-663X
刊名
Electronics and Communications in Japan
参考译名
日本电子学与通信,第2辑:电子学
收藏年代
2003~2010
关联期刊
参考译名
收藏年代
Electronics and Communications in Japan
日本电子学与通信
2008~2023
Electronics and Communications in Japan
日本电子学与通信,第1辑:通信
2004~2014
Electronics and Communications in Japan
日本电子学与通信,第3辑:电子科学基础
2003~2007
全部
2003
2004
2005
2006
2007
2009
2010
2003, vol.86, no.1
2003, vol.86, no.10
2003, vol.86, no.11
2003, vol.86, no.12
2003, vol.86, no.2
2003, vol.86, no.3
2003, vol.86, no.4
2003, vol.86, no.5
2003, vol.86, no.6
2003, vol.86, no.7
2003, vol.86, no.8
2003, vol.86, no.9
题名
作者
出版年
年卷期
On polarization of the Poynting flux
Shinobu Tokumaru
2003
2003, vol.86, no.8
Proposal and switching characteristics evaluation for waveguide-prism-deflector type micro optical switches (WPD-MOS)
Minoru Ninomiya; Yukihiko Arai; Tetsuzo Yoshimura; Hiroaki Kurokawa; Kunihiko Asama
2003
2003, vol.86, no.8
Measurements of the dielectric properties of nematic liquid crystals at 10 kHz to 40 GHz and application to a variable delay line
Toshihisa Kamei; Yozo Utsumi; Hiroshi Moritake; Kohji Toda; Hirosuke Suzuki
2003
2003, vol.86, no.8
High-density 3D packaging sidewall interconnection technology for CCD micro-camera visual inspection system
Hiroshi Yamada; Takashi Togasaki; Masanobu Kimura; Hajime Sudo
2003
2003, vol.86, no.8
Periodic-structure-type electromagnetic wave absorber analysis by the non-standard FDTD method using complex formulation
Tadao Ohtani; Tatsuya Kashiwa
2003
2003, vol.86, no.8
Origin of group delay ripple in chirped fiber Bragg gratings and its effective reduction method
Tetsuro Komukai; Tetsuro Inui; Masataka Nakazawa
2003
2003, vol.86, no.8
Studies on adsorption behavior of hemoglobin onto hydrophobic surface by using slab optical waveguide spectroscopy
Takamitsu Yoshida; Hajime Asano; Jose H. Santos; Zhi-Mei Qi; Akiko Takatsu; Kenji Kato; Naoki Matsuda
2003
2003, vol.86, no.8
Waveguide bandpass filter and FDTD analysis
Shinnya Harada; Yukio Iida
2003
2003, vol.86, no.8
Multitone curve-fitting algorithms for communication application ADC testing
Yoshito Motoki; Hidetaka Sugawara; Haruo Kobayashi; Takanori Komuro; Hiroshi Sakayori
2003
2003, vol.86, no.8
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