期刊


ISSN1042-0967
刊名Electronics and Communications in Japan
参考译名日本电子学与通信，第3辑：电子科学基础
收藏年代2003～2007

关联期刊参考译名收藏年代
Electronics and Communications in Japan日本电子学与通信2008～2023
Electronics and Communications in Japan日本电子学与通信，第1辑：通信2004～2014
Electronics and Communications in Japan日本电子学与通信，第2辑：电子学2003～2010


全部

2003 2004 2005 2006 2007

2003, vol.86, no.1 2003, vol.86, no.10 2003, vol.86, no.11 2003, vol.86, no.12 2003, vol.86, no.2 2003, vol.86, no.3
2003, vol.86, no.4 2003, vol.86, no.5 2003, vol.86, no.6 2003, vol.86, no.7 2003, vol.86, no.8 2003, vol.86, no.9

题名作者出版年年卷期
Detection of the second harmonic signals using an ultrasonic transducer with the separately arranged transmitter and receiverHideo Adachi; Katsuhiro Wakabayashi; Masahiro Nishio; Haruo Ogawa; Tomoo Kamakura20032003, vol.86, no.1
Segmentation of ultrasonic images by using locally adaptive filter and wavelet analysis: detection of superficial peripheral vein by a high-frequency ultrasonic equipmentAtushi Takemura; Masayasu Ito20032003, vol.86, no.1
Aliasing avoidance and reduction of computational complexity in Volterra filtersSatoshi Kinoshita; Yoshinobu Kajikawa; Yasuo Nomura20032003, vol.86, no.1
2D adaptive state-space filters suitable for parallel processing using state-space model with general formNaoya Ishizaki; Mitsuji Muneyasu; Takao Hinamoto20032003, vol.86, no.1
Do we really have to consider covariance matrices for image feature points?Yasushi Kanazawa; Kenichi Kanatani20032003, vol.86, no.1
Error detection capability for variable length codesTakeshi Chujoh20032003, vol.86, no.1
On universality of both Bayes codes and Ziv-Lempel codes for sources which emit data sequence by block unitTakashi Ishida; Masayuki Gotoh; Shigeichi Hirasawa20032003, vol.86, no.1
Amplification of information signals in chaotic maskingTachiki Nagai; Hidetomo Hamano; Tomoki Yoshida; Noriyuki Aida; Yasunari Hatasawa; Takashi Matsumoto20032003, vol.86, no.1
Extraction of fuzzy clusters from weighted graphsSeiji Hotta; Kohei Inoue; Kiichi Urahama20032003, vol.86, no.1
A testing-domain-dependent software reliability growth model for imperfect debugging environment and its evaluation of goodness-of-fitTakaji Fujiwara; Shigeru Yamada20032003, vol.86, no.1



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