期刊


ISSN0957-4522
刊名Journal of Materials Science
参考译名材料科学杂志：电子材料
收藏年代1999～2013



全部

1999 2000 2001 2002 2003 2004
2005 2006 2007 2008 2009 2010
2011 2012 2013

2003, vol.14, no.1 2003, vol.14, no.10-12 2003, vol.14, no.2 2003, vol.14, no.3 2003, vol.14, no.4 2003, vol.14, no.5-6-7
2003, vol.14, no.8 2003, vol.14, no.9

题名作者出版年年卷期
Confined epitaxial growth by low-pressure chemical vapor depositionK. Osman; N. S. Lloyd; J. M. Bonar; H. A. Kemhadjian; D. M. Bagnall; J. S. Hamol20032003, vol.14, no.5-6-7
Non-selective growth of SiGe heterojunction bipolar transistor layers at 700℃ with dual control of n- and p-type dopant profilesH. A. W. El Mubarek; J. M. Bonar; P. Ashburn; Y. Wang; P. Hemment; O. Buiu; S. Hall20032003, vol.14, no.5-6-7
Misfit dislocations in GaAsN/GaAs interfaceJ. Toivonen; T. Tuomi; J. Riikonen; L. Knuuttila; T. Hakkarainen; M. Sopanen; H. Lipsanen; P. J. Mcnally; W. Chen; D. Lowney20032003, vol.14, no.5-6-7
AlGaN/GaN HEMTS: material, processing, and characterizationF. Calle; T. Palacios; E. Monroy; J. Grajal; M. Verdu; Z. Bougrioua; I. Moerman20032003, vol.14, no.5-6-7
High-temperature strength of bulk single crystals of III-V nitridesI. Yonenaga20032003, vol.14, no.5-6-7
Tilted-wing-induced stress distribution in epitaxial lateral overgrown GaNW. M. Chen; P. J. Mcnally; J. Kanatharana; D. Lowney; K. Jacobs; T. Tuomi; L. Knuuttila; J. Riikonen; J. Toivonen20032003, vol.14, no.5-6-7
Electrical characterization of MIS capacitors fabricated from ECR-PECVD silicon oxide and silicon nitride bilayer filmsH. Castan; S. Duenas; J. Barbolla; E. San Andres; A. Del Prado; I. Martil; G. Gonzalez-Diaz20032003, vol.14, no.5-6-7
Structural and optical characterization of CuInS{sub}2 thin films grown by vacuum evaporation methodY. Akaki; H. Komaki; K. Yoshino; T. Ikari20032003, vol.14, no.5-6-7
Effect of high hydrostatic pressure during annealing on silicon implanted with oxygenA. Misiuk; A. Barcaz; J. Ratajczak; L. Bryja20032003, vol.14, no.5-6-7
Transfer of thin Si layers by cold and thermal ion cuttingK. Henttinen; T. Suni; A. Nurmela; H. V. A. Luoto; I. Suni; V. -M. Airaksinen; S. Karirinne; M. Cai; S. S. Lau20032003, vol.14, no.5-6-7
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