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期刊
ISSN
0957-4522
刊名
Journal of Materials Science
参考译名
材料科学杂志:电子材料
收藏年代
1999~2013
全部
1999
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2007, vol.18, no.10
2007, vol.18, no.11
2007, vol.18, no.12
2007, vol.18, no.1-3
2007, vol.18, no.1sup
2007, vol.18, no.4
2007, vol.18, no.5
2007, vol.18, no.6
2007, vol.18, no.7
2007, vol.18, no.8
2007, vol.18, no.9
题名
作者
出版年
年卷期
Stress analysis of spontaneous Sn whisker growth
K. N. Tu; Chih Chen; Albert T. Wu
2007
2007, vol.18, no.1-3
Life expectancies of Pb-free SAC in electronic hardware
Michael Osterman; Abhijit Dasgupta
2007
2007, vol.18, no.1-3
Impact of the ROHS directive on high-performance electronic systems - Part I: need for lead utilization in exempt systems
Karl J. Puttlitz; George T. Galyon
2007
2007, vol.18, no.1-3
Impact of the ROHS Directive on high-performance electronic systems - Part II: key reliability issues preventing the implementation of lead-free solders
Karl J. Puttlitz; George T. Galyon
2007
2007, vol.18, no.1-3
Issues related to the implementation of Pb-free electronic solders in consumer electronics
D. R. Frear
2007
2007, vol.18, no.1-3
Sn-whiskers: truths and myths
J. W. Osenbach; J. M. DeLucca; B. D. Potteiger; A. Amin; F. A. Baiocchi
2007
2007, vol.18, no.1-3
Tin pest issues in lead-free electronic solders
W. J. Plumbridge
2007
2007, vol.18, no.1-3
Electromigration statistics and damage evolution for Pb-free solder joints with Cu and Ni UBM in plastic flip-chip packages
Seung-Hyun Chae; Xuefeng Zhang; Kuan-Hsun Lu; Huang-Lin Chao; Paul S. Ho; Min Ding; Peng Su; Trent Uehling; Lakshmi N. Ramanathan
2007
2007, vol.18, no.1-3
Electromigration issues in lead-free
Chih Chen; S. W. Liang
2007
2007, vol.18, no.1-3
Assessment of factors influencing thermomechanical fatigue behavior of Sn-based solder joints under severe service environments
K. N. Subramanian
2007
2007, vol.18, no.1-3
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