期刊


ISSN0957-4522
刊名Journal of Materials Science
参考译名材料科学杂志:电子材料
收藏年代1999~2013



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1999 2000 2001 2002 2003 2004
2005 2006 2007 2008 2009 2010
2011 2012 2013

2008, vol.19, no.1 2008, vol.19, no.10 2008, vol.19, no.11 2008, vol.19, no.12 2008, vol.19, no.2 2008, vol.19, no.3
2008, vol.19, no.4 2008, vol.19, no.5 2008, vol.19, no.6 2008, vol.19, no.7 2008, vol.19, no.8-9

题名作者出版年年卷期
Luminescent properties of nanoparticles LaSrAl{sub}3O{sub}7:RE{sup}(3+) (RE = Eu, Tb) via the citrate sol-gel methodAmurisana Bao; Chunyan Tao; Hua Yang20082008, vol.19, no.5
Influence of a SiN mask on GaN layer by metalorganic chemical vapor depositionDeok Kyu Kim20082008, vol.19, no.5
Nanostructure formation in vacuum evaporated zinc phthalocyanine (ZnPc) thin filmsS. Senthilarasu; Y. B. Hahn; Soo-Hyoung Lee20082008, vol.19, no.5
Electronic characterization of several 100 μm thick epitaxial GaAs layersN. Talbi; K. Khirouni; G. C. Sun; H. Samic; J. C. Bourgoin20082008, vol.19, no.5
Effect of underfill on bending fatigue behavior of chip scale packageBo-In Noh; Noh-Chang Park; Won-Sik Hong; Seung-Boo Jung20082008, vol.19, no.5
Two-step annealing of hot wire chemical vapor deposited a-Si:H filmsB. Roy; R. C. Reedy; D. W. Readey20082008, vol.19, no.5
The local structure of bismuth borate glasses doped with europium ions evidenced by FT-IR spectroscopyPetru Pascuta; Lidia Pop; Simona Rada; Maria Bosca; Eugen Culea20082008, vol.19, no.5
Formation and simulation of a thermally stable NiSi FUSI gate electrode by a novel integration processS. Y. Tan; Hsien-Chia Chili; Yi-Yang Chen; C. L. Sung20082008, vol.19, no.5
High tunabilty Ba{sub}0.6Sr{sub}0.4TiO{sub}3 thin films fabricated on Pt-Si substrates with La{sub}0.5Sr{sub}0.5CoO{sub}3 buffer layerW. F. Qin; J. Xiong; J. Zhu; J. L. Tang; W. J. Jie; X. H. Wei; Y. Zhang; Y. R. Li20082008, vol.19, no.5
Stress sensitivity of inductance in NiMgCuZn ferrites and development of a stress insensitive ferrite composition for microinductorsNarla Varalaxmi; N. Ramamanohar Reddy; Mudinepalli Venkata Ramana; Eyunni Rajagopal; V. Ramakrishna Murthy; Kota Venkata Sivakumar20082008, vol.19, no.5
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