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题名	作者	出版年	年卷期
Pushing the limits of SPM	Joost W. M. Frenken; Tjerk H. Oosterkamp; Bas L. M. Hendriksen; Marcel J. Rost	2005	2005, vol.8, no.5
Fast-scanning STM studies	Flemming Besenbacher; Erik Laegsgaard; Ivan Stensgaard	2005	2005, vol.8, no.5
AFM's path to atomic resolution	Franz J. Giessibl	2005	2005, vol.8, no.5
Friction force microscopy	Roland Bennewitz	2005	2005, vol.8, no.5
Near-field Raman microscopy	Neil Anderson; Achim Hartschuh; Lukas Novotny	2005	2005, vol.8, no.5