期刊


ISSN2043-0655
刊名Microscopy and Analysis
参考译名显微镜学与分析——欧洲版
收藏年代2008～2012



全部

2008 2009 2010 2011 2012

2010 2010, vol.2010 SUPPL..

题名作者出版年年卷期
Analysis of Spectrum-Imaging Datasets in Atomic-Resolution Electron MicroscopyMasashi Watanabe; Eiji Okunishi; Kazuo Ishizuka20102010
Transmission Microscopy without Lenses: Principles, Benefits and ApplicationsJohn Rodenburg; Andrew Maiden20102010
LM and SEM Metallographical Study of Gear Teeth in Bucket-Wheel ExcavatorsAthanasios Vazdirvanidis; George Pantazopoulos; Konstantinos Stamatakis20102010
Spinning Disk Confocal Microscopy of Calcium Signalling in Blood Vessel WallsMark Nelson; Jonathan Ledoux; Mark Taylor; Adrian Bonev; Rachael Hannah; Viktoriya Solodushko; Bo Shui; Yvonne Tallini; Michael Kotlikoff20102010
Analytical TEM of Materials using a Large Area Silicon Drift EDS DetectorMing Q. Chu20102010
Three-Dimensional Reconstruction of the Cornea by Electron TomographyGeraint J. Parfitt; Christian Pinali; Philip N. Lewis; Robert D. Young; Andrew J. Quantock; Carlo Knupp20102010
Nanoscale Infrared Spectroscopy of Materials by Atomic Force MicroscopyCraig Prater; Kevin Kjoller; Debra Cook; Roshan Shetty; Gregory Meyers; Carl Reinhardt; Jonathan Felts; William King; Konstantin Vodopyanov; Alexandre Dazzi20102010
Unravelling the Local Electronic Properties in Complex Nanoscale Systems with CI-AFMPeter N. Nirmalraj; Jonathan N. Coleman; John J. Boland20102010
Combined AFM and Optical Techniques: From Biology to SolarRay J. Boucher20102010
Scanning Surface Potential and Navigated Atomic Force Microscopy of PigmentsRay J. Boucher20102010
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