期刊


ISSN0958-1952
刊名Microscopy and Analysis
参考译名显微镜学与分析——英国版
收藏年代2008～2012



全部

2008 2009 2010 2011 2012

2011 2011, vol.2011, no.SUPPL.

题名作者出版年年卷期
Olympus Soft Imaging SolutionsJulian P. Heath20112011, vol.2011, no.SUPPL.
Electron Microscopy SciencesJulian P. Heath20112011, vol.2011, no.SUPPL.
2010 under the Microscope: A Review of New Instruments and TechnologyJulian P. Heath20112011, vol.2011, no.SUPPL.
Atomic Resolution Secondary Electron Imaging in Aberration Corrected STEMHiromi Inada; Mitsuru Konno; Keiji Tamura; Yuya Suzuki; Kuniyasu Nakamura; Yimei Zhu20112011
Low Beam-Energy Energy-Dispersive X-Ray Spectroscopy for NanotechnologyPatrick Camus20112011
Development of a High Throughput Electron Microscope for Nanoscale AnalysisMitsuhide Matsushita; Shuji Kawai; Takeshi Iwama; Katsuhiro Tanaka; Toshiko Kuba; Noriaki Endo; Thomas C. Isabell20112011
Bonding and TSV in 3D IC Integration: Physical Analysis with a Plasma FIBMaaike M. V. Taklo; Armin Klumpp; Peter Ramm; Laurens Kwakman; German Franz20112011
Variable Pressure Scanning Electron Microscopy of Vicia faba Stigmatic PapillaeWen Chen; Fred Stoddard; Timothy C. Baldwin20112011
Fracture Surface, Impact Energy and Hardness of Ni-Free High-Mn SteelsWei Sha; H. H. Haji Talib; Eric A. Wilson; Raj Rajendran; Savko Malinov; Harvey R. Charlesworth; Lee Ibbitson20112011
Comparison of Electron Detector Systems for Transmission Electron MicroscopyPetra Bele20112011
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