期刊


ISSN0957-4522
刊名Journal of Materials Science
参考译名材料科学杂志：电子材料
收藏年代1999～2013



全部

1999 2000 2001 2002 2003 2004
2005 2006 2007 2008 2009 2010
2011 2012 2013

2010, vol.21, no.1 2010, vol.21, no.10 2010, vol.21, no.11 2010, vol.21, no.12 2010, vol.21, no.2 2010, vol.21, no.3
2010, vol.21, no.4 2010, vol.21, no.5 2010, vol.21, no.6 2010, vol.21, no.7 2010, vol.21, no.8 2010, vol.21, no.9

题名作者出版年年卷期
A novel narrow band gap red light-emitting cyanovinylene polymer derived from 3,4-dialkoxy thiophene for optoelectronic applicationsM. G. Manjunatha; A. V. Adhikari; P. K. Hegde20102010, vol.21, no.8
Optical studies of Au@SnO_2/poly-(vinyl) alcohol core-shell nanoparticle thin filmsSuraj Kumar Tripathy; Jin-Nyoung Jo; Kwang-Joong, O.; Sang-Do Han; In-Hwan Lee; Yeon-Tae Yu20102010, vol.21, no.8
Microwave assisted synthesis of ZnO:Cu nano-phosphors and their photoluminescence behaviourAtul Gupta; Sunil Kumar; H. S. Bhatti20102010, vol.21, no.8
Effect of ultrasonication medium on the properties of copper nanoparticle-filled epoxy composite for electrical conductive adhesive (ECA) applicationK. L. Chan; M. Mariatti; Z. Lockman; L. C. Sim20102010, vol.21, no.8
Reliability studies of Sn-9Zn/Cu and Sn-9Zn-0.3Ag/Cu soldered joints with aging treatmentWen-Xue Chen; Song-Bai Xue; Hui Wang; Yu-Hua Hu20102010, vol.21, no.8
Fracture prediction of dissimilar thin film materials in Cu/low-k packagingChang-Chun Lee; Chien-Chen Lee; Ya-Wen Yang20102010, vol.21, no.8
Dielectric properties, microstructure and diffuse transition of Al-doped Ba(Zr_(0.2)Ti_(0.8))O_3 ceramicsWei Cai; Chunlin Fu; Jiacheng Gao; Xiaoling Deng20102010, vol.21, no.8
The influence of rapid thermal annealing on electrical and structural properties of Pt/Au Schottky contacts to n-type InPM. Bhaskar Reddy; V. Janardhanam; A. Ashok Kumar; V. Rajagopal Reddy; P. Narasimha Reddy; Chel-Jong Choi; Ranju Jung; Sung Hur20102010, vol.21, no.8
Phase component and conductivities of Co-doped BaTiO_3 thermistorsJian Wang; Hong Zhang; Yiyu Li; Zhicheng Li20102010, vol.21, no.8
Measurements of dielectric properties of TiO_2 thin films at microwave frequencies using an extended cavity perturbation techniqueJyh Sheen; Chueh-Yu Li; Liang-Wen Ji; Wei-Lung Mao; Weihsing Liu; Chin-An Chen20102010, vol.21, no.8
12



制造业外文文献服务平台