期刊


ISSN1546-1998
刊名Journal of Low Power Electronics
参考译名低功耗电子学杂志
收藏年代2006～2019



全部

2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019

2011, vol.7, no.1 2011, vol.7, no.2 2011, vol.7, no.3 2011, vol.7, no.4

题名作者出版年年卷期
Ultra Low Energy CMOS Logic Using Below-Threshold Dual-Voltage SupplyKyungseok Kim; Vishwani D. Agrawal20112011, vol.7, no.4
A Variation-Aware Taylor Expansion Diagram-Based Approach for Nano-CMOS Register-Transfer Level Leakage OptimizationShibaji Banerjee; Jimson Mathew; Saraju P. Mohanty; Dhiraj K. Pradhan; Maciej J. Ciesielski20112011, vol.7, no.4
A Polynomial Based Approach to Wakeup Time and Energy Estimation in Power-Gated Logic ClustersVivek D. Tovinakere; Olivier Sentieys; Steven Derrien20112011, vol.7, no.4
Trading Accuracy for Power in a Multiplier ArchitectureParag Kulkarni; Puneet Gupta; Milos D. Ercegovac20112011, vol.7, no.4
Design Techniques with Multiple Scan Compression CoDecs for Low Power and High Quality Scan TestArvind Jain; Sundarrajan Subramanian; Rubin A. Parekhji; Srivaths Ravi20112011, vol.7, no.4
Analyzing and Improving Performance and Energy Efficiency of AndroidTapas Kumar Kundu; Kolin Paul20112011, vol.7, no.4
Studying the Influence of Chip Temperatures on Timing Integrity Using Improved Power ModelingAndras Timar; Marta Rencz20112011, vol.7, no.4
Inclusion of Power Consumption Information in High-Level Modeling of Linear Analog BlocksLaurent Bousquet; Fabio Cenni; Emmanuel Simeu20112011, vol.7, no.4
Power-Efficient Application of Sleep Transistors to Enhance the Reliability of Integrated CircuitsClaas Cornelius; Frank Sill Torres; Dirk Timmermann20112011, vol.7, no.4
On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical ApplicationsR. S. Oliveira; J. Semiao; I. C. Teixeira; M. B. Santos; J. P. Teixeira20112011, vol.7, no.4
12



制造业外文文献服务平台