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期刊
ISSN
0741-3106
刊名
IEEE Electron Device Letters
参考译名
IEEE电子器件快报
收藏年代
1998~2007
全部
1998
1999
2000
2001
2002
2003
2004
2005
2006
2007
2006, vol.27, no.1
2006, vol.27, no.10
2006, vol.27, no.11
2006, vol.27, no.12
2006, vol.27, no.2
2006, vol.27, no.3
2006, vol.27, no.4
2006, vol.27, no.5
2006, vol.27, no.6
2006, vol.27, no.7
2006, vol.27, no.8
2006, vol.27, no.9
题名
作者
出版年
年卷期
Planar Integration of E/D-Mode AlGaN/GaN HEMTs Using Fluoride-Based Plasma Treatment
Ruonan Wang; Yong Cai; Wilson Tang; Kei May Lau; Kevin J. Chen
2006
2006, vol.27, no.8
High-Efficiency Enhancement-Mode Power Heterojunction FET With Buried p{sup}+-GaAs Gate Structure for Low-Voltage-Operated Mobile Applications
Yasunori Bito; Yoshiaki Yamakawa; Shinichi Tanaka; Naotaka Iwata
2006
2006, vol.27, no.8
Structural Advantage for the EOT Scaling and Improved Electron Channel Mobility by Incorporating Dysprosium Oxide (Dy{sub}2O{sub}3) Into HfO{sub}2 n-MOSFETs
Tackhwi Lee; Se Jong Rhee; Chang Yong Kang; Feng Zhu; Hyoung-sub Kim; Changhwan Choi; Injo Ok; Manhong Zhang; Siddarth Krishnan; Gaurav Thareja; Jack C. Lee
2006
2006, vol.27, no.8
Hafnium Silicate Nanocrystal Memory Using Sol-Gel-Spin-Coating Method
Hsin-Chiang You; Tze-Hsiang Hsu; Fu-Hsiang Ko; Jiang-Wen Huang; Tan-Fu Lei
2006
2006, vol.27, no.8
Linewidth Effect and Phase Control in Ni Fully Silicided Gates
J. A. Kittl; A. Lauwers; T. Hoffmann; A. Veloso; S. Kubicek; M. Niwa; M. J. H. van Dal; M. A. Pawlak; C. Demeurisse; C. Vrancken; B. Brijs; P. Absil; S. Biesemans
2006
2006, vol.27, no.8
Fully Elastic Interconnects on Nanopatterned Elastomeric Substrates
Prashant Mandlik; Stephanie P. Lacour; Jason W. Li; Stephen Y. Chou; Sigurd Wagner
2006
2006, vol.27, no.8
SONOS-Type Flash Memory Using an HfO{sub}2 as a Charge Trapping Layer Deposited by the Sol-Gel Spin-Coating Method
Hsin-Chiang You; Tze-Hsiang Hsu; Fu-Hsiang Ko; Jiang-Wen Huang; Wen-Luh Yang; Tan-Fu Lei
2006
2006, vol.27, no.8
UV Photo-Responsive Characteristics of an n-Channel GaN Schottky-Barrier MISFET for UV Image Sensors
Heon-Bok Lee; Hyun-Su An; Hyun-Ick Cho; Jung-Hee Lee; Sung-Ho Hahm
2006
2006, vol.27, no.8
Correlating Drain-Current With Strain-Induced Mobility in Nanoscale Strained CMOSFETs
Hong-Nien Lin; Hung-Wei Chen; Chih-Hsin Ko; Chung-Hu Ge; Horng-Chih Lin; Tiao-Yuan Huang; Wen-Chin Lee
2006
2006, vol.27, no.8
Decoupling of Cold-Carrier Effects in Hot-Carrier Reliability Assessment of HfO{sub}2 Gated nMOSFETs
Hokyung Park; Rino Choi; Byoung Hun Lee; Seung-Chul Song; Man Chang; Chadwin D. Young; Gennadi Bersuker; Jack C. Lee; Hyunsang Hwang
2006
2006, vol.27, no.8
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