期刊


ISSN2043-0647
刊名Microscopy and Analysis
参考译名显微镜学与分析——亚太版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2010 2010, no.2010 SUPPL..

题名作者出版年年卷期
Carl Zeiss NTS: Maximum Information-Maximum InsightRay J. Boucher20102010, no.2010 SUPPL..
TescanRay J. Boucher20102010, no.2010 SUPPL..
SkyScan: SkyScan is the biggest producer of microtomography and nanotomography instruments in the worldRay J. Boucher20102010, no.2010 SUPPL..
Olympus Soft Imaging SolutionsRay J. Boucher20102010, no.2010 SUPPL..
FEIRay J. Boucher20102010, no.2010 SUPPL..
Electron Microscopy SciencesRay J. Boucher20102010, no.2010 SUPPL..
2009 under the Microscope: Advanced Imaging and Super resolution LM SystemsJulian P. Heath20102010, no.2010 SUPPL..
Nanoscale Chemical Compositional Analysis with an Innovative S/TEM-EDX SystemPeter Schlossmacher; Dmitri O. Klenov; Bert Freitag; Sebastian von Harrach; Andy Steinbach20102010
Development of a Cold Field-Emission Gun for a 200kV Atomic Resolution Electron MicroscopeYuji Kohno; Eiji Okunishi; Takeshi Tomita; Isamu Ishikawa; Toshikatsu Kaneyama; Yoshihiro Ohkura; Yukihito Kondo; Thomas Isabell20102010
Helium Ion Beam Processing for Nano-fabrication and Beam-Induced ChemistryPaul Alkemade; Vadim Sidorkin; Ping Chen; Emile van der Drift; Anja van Langen; Diederik Maas; Emile van Veldhoven; Larry Scipioni20102010
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