期刊


ISSN2043-0647
刊名Microscopy and Analysis
参考译名显微镜学与分析——亚太版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2014 2014, no.Suppl. 2014, no.Suppl.1

题名作者出版年年卷期
Investigating cell mechanics with atomic force microscopyAndrea Slade; Bede Pittenger; Pascale Milani; Arezki Boudaoud; Olivier Hamant; Petra Kioschis; Leslie M. Ponce; Mathias Hafner20142014, no.Suppl.1
Photothermal excitation for improved cantilever drive performance in tapping mode atomic force microscopyAleksander Labuda; Jason Cleveland; Nicholas A. Geisse; Marta Kocun; Ben Ohler; Roger Proksch; Mario B. Viani; Deron Walters20142014, no.Suppl.1
WITec: Nearfield-Raman - Imaging beyond the diffraction limitJulian P. Heath20142014, no.Suppl.1
PARK SYSTEMS: Innovative 3D AFM Technology for High Resolution Sidewall ImagingJulian P. Heath20142014, no.Suppl.1
BRUKER NANO SURFACES Performing sub-molecular imaging of the DNA double helix with PeakForce TappingJulian P. Heath20142014, no.Suppl.1
ASYLUM RESEARCH an Oxford Instruments Company: Scanning Microwave Impedance Microscopy (sMIM) for High Resolution Electrical CharacterizationJulian P. Heath20142014, no.Suppl.1
AGILENT: NEW technique combines SECM and AFM to enhance research capabilitiesJulian P. Heath20142014, no.Suppl.1
The evolution of fountain pen nanolithography: Controlled multi-probe delivery of liquids and gasesTalia Yeshua; Shalom Weinberger; Hesham Taha; Aaron Lewis; Michael Layani; Shlomo Magdassi; Christian Lehmann; Stephanie Reich; Chaim Sukenik; Sophia Kokotov; Rimma Dekhter20142014, no.Suppl.1
Development of copper-based metal matrix composites: An analysis by SEM, EDS and XRDSyed Nasimul Alam; Harshpreet Singh20142014, no.Suppl.
Analysis of advanced ceramic materials with phase mapping energy-dispersive X-ray spectroscopyTara Nylese; Mike Coy20142014, no.Suppl.
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