期刊


ISSN2043-0647
刊名Microscopy and Analysis
参考译名显微镜学与分析——亚太版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2008, no.61 2008, no.63 2008, no.64 2008, no.65 2008, no.66

题名作者出版年年卷期
Application of Optimum HRTEM Noise Filters in Mineralogy and Related SciencesToshihiro Kogure; Paul H. C. Eilers; Kazuo Ishizuka20082008, no.66
A Cryo-Transmission Electron Microscopy Study of Asymmetric PMMA CopolymersChristopher Parmenter; Svetla Stoilova-McPhie; Stefan Bon20082008, no.66
Morphology, Physicochemistry and Phase Analysis of Neuburg Siliceous EarthJurgen Goske; Werner Kachler20082008, no.65
Characterization of the Microstructural Aspects of Machinable α-β Phase BrassG. Pantazopoulos; A. Vazdirvanidis20082008, no.65
Noise and Colocalization in Fluorescence Microscopy: Solving a ProblemJeremy Adler; Fredrik Bergholm; Stamatis N. Pagakis; Ingela Parmryd20082008, no.65
Fractography of Brittle Materials: Analysis of Fractures in Ceramics and GlassesGeorge D. Quinn20082008, no.64
Microscopy of Semiconductor Nano- and Microwires with Waveguiding BehaviourJavier Piqueras; Pedro Hidalgo; Emilio Nogales; Bianchi Mendez; Jose Angel Garcia20082008, no.64
Advanced Monochromatic STEM for Nano-Electronics Industry ApplicationsC. H. Tung; M. Bosman; C. K. Cheng20082008, no.64
Electron Microscope CamerasJulian P. Heath20082008, no.63
Green LED Array ModulesJulian P. Heath20082008, no.63
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