期刊


ISSN2043-0647
刊名Microscopy and Analysis
参考译名显微镜学与分析——亚太版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2011 2011, vol.2011, no.SUPPL.

题名作者出版年年卷期
Electron Microscopy SciencesRay J. Boucher20112011, vol.2011, no.SUPPL.
Olympus Soft Imaging SolutionsRay J. Boucher20112011, vol.2011, no.SUPPL.
2010 under the Microscope: A Review of New Instruments and TechnologyJulian P. Heath20112011, vol.2011, no.SUPPL.
Atomic Resolution Secondary Electron Imaging in Aberration Corrected STEMHiromi Inada; Mitsuru Konno; Keiji Tamura; Yuya Suzuki; Kuniyasu Nakamura; Yimei Zhu20112011
Development of a High Throughput Electron Microscope for Nanoscale AnalysisMitsuhide Matsushita; Shuji Kawai; Takeshi Iwama; Katsuhiro Tanaka; Toshiko Kuba; Noriaki Endo; Thomas C. Isabell20112011
Bonding and TSV in 3D IC Integration: Physical Analysis with a Plasma FIBMaaike M. V. Taklo; Armin Klumpp; Peter Ramm; Laurens Kwakman; German Franz20112011
Variable Pressure Scanning Electron Microscopy of Vicia faba Stigmatic PapillaeWen Chen; Fred Stoddard; Timothy C. Baldwin20112011
Widefield Fluorescence Microscopy of Centrosome Separation in DT40 CellsHelfrid Hochegger20112011
Review of Plasma Cleaning Technology for Decontamination in FIB, SEM and TEMTom Levesque20112011
Nanoparticle Tracking Analysis of Cell Exosome and Nanovesicle SecretionSimon J. Fowls; Chin Y. Soo; Ying Zheng; Elaine C. Campbell; Andrew Riches20112011
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