期刊


ISSN2043-0647
刊名Microscopy and Analysis
参考译名显微镜学与分析——亚太版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2015 2015, no.Suppl.

题名作者出版年年卷期
Fast quantitative AFM nano-mechanical measurements using AM-FM Viscoelastic Mapping ModeDonna Hurley; Marta Kocun; Irene Revenko; Ben Ohler; Roger Proksch20152015, no.Suppl.
Applications of AFM-based nanoscale infrared spectroscopy: A conducting polymer and an amyloid-like proteinCurtis Marcott; Alexandre Dazzi; Samy Remita; Francesco Simone Ruggeri; Giovanni Dietler; Yves Jacquot20152015, no.Suppl.
Correlative SPM, Raman and SEM analytic of biomedical devices and coatingsM. Martina; S. Rohler; P. Ingrino; C. J. Burkhardt20152015, no.Suppl.
WITec: Imaging of vessels with combined Raman-AFM ImagingChris Parmenter20152015, no.Suppl.
OXFORD INSTRUMENTS: Measuring surface roughness with AFMChris Parmenter20152015, no.Suppl.
OXFORD INSTRUMENTS: AFM-based microrheology on cells with the Asylum Research MFP-3D-BIOChris Parmenter20152015, no.Suppl.
HITACHI HIGH-TECH SCIENCE: SEM and SPM comparative measurements without air exposureChris Parmenter20152015, no.Suppl.
BRUKER NANO SURFACESChris Parmenter20152015, no.Suppl.
Bruker microCTChris Parmenter20152015, no.Suppl.
Evactron By XEI ScientificChris Parmenter20152015, no.Suppl.
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