期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2000, vol.21, no.1 2000, vol.21, no.10 2000, vol.21, no.11 2000, vol.21, no.12 2000, vol.21, no.2 2000, vol.21, no.3
2000, vol.21, no.4 2000, vol.21, no.5 2000, vol.21, no.6 2000, vol.21, no.7 2000, vol.21, no.8 2000, vol.21, no.9

题名作者出版年年卷期
25.5% efficient Ga{sub}0.35In{sub}0.65P/Ga{sub}0.83In{sub}0.17As tandem solar cells grown on GaAs substratesF. Dimroth; U. Schubert; A. W. Bett20002000, vol.21, no.5
A novel flash EEPROM cell based on trench technology for integration within power integrated circuitsD. M. Garner; Y. Chen; L. Sabesan; G. A. J. Amaratunga; A. Blackburn; J. Clark; S. S. Sekiariapuram; A. G. R. Evans20002000, vol.21, no.5
A simple and reliable wafer-level electrical probing technique for III-nitride light-emitting epitaxial structuresY. S. Zhao; C. L. Jensen; R. W. Chuang; H. P. Lee; Z. J. Dong; R. Shih20002000, vol.21, no.5
An all-solid-state inorganic electrochromic display of WO{sub}3 and NiO films with LiNbO{sub}3 ion conductorZhang Xuping; Zhang Haokang; Li Qing; Luo Hongli20002000, vol.21, no.5
An analytical solution to a double-gate MOSFET with undoped bodyYuan Taur20002000, vol.21, no.5
Application of high pressure deuterium annealing for improving the hot carrier reliability of CMOS transistorsJinju Lee; Kangguo Cheng; Zhi Chen; Karl Hess; Joseph W. Lyding; Young-Kwang Kim; Hyui-Seung Lee; Young-Wug Kim; Kwang-Pyuk Suh20002000, vol.21, no.5
Deep submicrometer SOI MOSFET drain current model including series resistance, self-heating and velocity overshoot effectsJ. B. Roldan; F. Gamiz; J. A. Lopez-Villanueva; P. Cartujo-Cassinello20002000, vol.21, no.5
Design of 25-nm SALVO PMOS devicesH. -H. Vuong; C. -P. Chang; C. -S. Pai20002000, vol.21, no.5
Electron and hole mobility enhancement in strained-Si MOSFET's on SiGe-on-insulator substrates fabricated by SIMOX technologyT. Mizuno; S. Takagi; N. Sugiyama; H. Satake; A. Kurobe; A. Toriumi20002000, vol.21, no.5
Frequency multiplier measurements on heterostructure barrier varactors on a copper substrateLars Dillner; Wlodek Strupinski; Stein Hollung; Chris Mann; Jan Stake; Matthew Beardsley; Erik Kollberg20002000, vol.21, no.5
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