期刊


ISSN2043-0647
刊名Microscopy and Analysis
参考译名显微镜学与分析——亚太版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2008, no.61 2008, no.63 2008, no.64 2008, no.65 2008, no.66

题名作者出版年年卷期
Advanced Monochromatic STEM for Nano-Electronics Industry ApplicationsC. H. Tung; M. Bosman; C. K. Cheng20082008, no.64
Microscopy of Semiconductor Nano- and Microwires with Waveguiding BehaviourJavier Piqueras; Pedro Hidalgo; Emilio Nogales; Bianchi Mendez; Jose Angel Garcia20082008, no.64
Fractography of Brittle Materials: Analysis of Fractures in Ceramics and GlassesGeorge D. Quinn20082008, no.64



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