期刊


ISSN2043-0647
刊名Microscopy and Analysis
参考译名显微镜学与分析——亚太版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2009 2009, no. tn68 2009, no.2009 suppl 2009, no.67 2009, no.70

题名作者出版年年卷期
Scanning Probe Microscopy of Palladium and Nickel Islands on Gallium NitrideChristiane Norenberg; Sverre Myhra; Peter Dobson20092009
Applications of Atomic Force Microscopy in Pharmaceutical ResearchClive J. Roberts20092009
Bimodal Atomic Force Microscopy Imaging of Collagen Fiber UltrastructureElena Tomas Herruzo; Ricardo Garcia; Roger B. Proksch; Irene Revenko; Monteith G. Heaton20092009
Applications of Single- and Double-Walled Carbon Nanotube SPM ProbesJulian P. Heath20092009
Scanning Ion Conductance Microscopy: Non-Contact Imaging and ElectrophysiologyY.-K. Yoo; K.-D. Ryang; S.-J. Cho20092009
Combined Raman Imaging and High Resolution AFM of Carbon NanotubesU. Schmidt; T. Dieing; A. Jauss; H. Fischer; O. Hollricher20092009
Improved DQE for TEM Imaging Plates by Correction of Geometric DistortionPetra Bele20092009
Applications of Helium Ion Microscopy in Semiconductor ManufacturingRainer Reiche; Rainer Kaesmaier; Rudiger Rosenkranz; Uwe Ritter; Steffen Teichert; Susann Leinert20092009
Scanning Electron Microscopical Analysis of Incandescent Lamp Tungsten FilamentsSyed Nasimul Alam20092009
Variable Pressure and Environmental SEM of Thin-Film Liquid Crystal/Polymer CompositesKashma K. Rai; Sameet K. Shriyan; Adam K. Fontecchio20092009
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