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期刊
ISSN
2043-0647
刊名
Microscopy and Analysis
参考译名
显微镜学与分析——亚太版
收藏年代
2008～2016
全部
2008
2009
2010
2011
2012
2013
2014
2015
2016
2013
2013, vol.2013
2013, vol.2013, no.SUPPL.
题名
作者
出版年
年卷期
Simultaneous in situ SEM and STEM analysis of gas/catalyst reaction in a cold field-emission environmental TEM
Hiroaki Matsumoto; Mitsuru Konno; Takeshi Sato; Isao Nagaoki; Toshie Yaguchi; Jane Y. Howe
2013
2013
A thermal field-emission electron probe microanalyzer for improved analytical spatial resolution
John T. Armstrong; Peter McSwiggen; Charles Nielsen
2013
2013
An eye for atoms
Julian P. Heath
2013
2013
Spinning disk microscope images deep within a cell
Julian P. Heath
2013
2013
AFM shows clear images of hydrogen bonds
Julian P. Heath
2013
2013
STM unravels titanium dioxide dynamics
Julian P. Heath
2013
2013
Imaging tracks worm brains
Julian P. Heath
2013
2013
Deadly parasite images unveiled
Julian P. Heath
2013
2013
Applications of new focused ion beams in nanofabrication and material studies
Brent P. Gila
2013
2013
Nano-analytical transmission electron microscopy of advanced semiconductor devices
Keith Thompson
2013
2013
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