期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2001, vol.22, no.1 2001, vol.22, no.10 2001, vol.22, no.11 2001, vol.22, no.12 2001, vol.22, no.6 2001, vol.22, no.7
2001, vol.22, no.8 2001, vol.22, no.9 2001, vol.22，no.2 2001, vol.22，no.3 2001, vol.22，no.4 2001, vol.22，no.5

题名作者出版年年卷期
AlGaN/AlN/GaN high-power microwave HEMTL. Shen; S. Heikman; B. Moran; R. Coffie; N. -Q. Zhang; D. Buttari; I. P. Smorchkova; S. Keller; S. P. DenBaars; U. K. Mishra20012001, vol.22, no.10
Low-operation voltage of InGaN/GaN light-emitting diodes with Si-doped In{sub}0.3Ga{sub}0.7N/Gan short-period superlattice tunneling contact layerJ. K. Sheu; J. M. Tsai; S. C. Shei; W. C. Lai; T. C. Wen; C. H. Kou; Y. K. Su; S. J. Chang; G. C. Chi20012001, vol.22, no.10
Impact of silicide formation on the resistance of common source/drain regionBing-Yue Tsui; Ming-Da Wu; Tian-Choy Gan20012001, vol.22, no.10
Active circuits under wire bonding I/O pads in 0.13 μm eight-level Cu metal, FSG low-K inter-metal dielectric CMOS technology{sup}+Kuo-Yu Chou; Ming-Jer Chen20012001, vol.22, no.10
Readout circuit in active pixel sensors in amorphous silicon technologyKarim S. Karim; Arokia Nathan20012001, vol.22, no.10
A novel high-performance poly-silicon thin film transistor with a self-aligned thicker sub-gate oxide near the drain/source regionsKow Ming Chang; Yuan Hung Chung; Gin Ming Lin; Jian Hong Lin; Chi Gun Deng20012001, vol.22, no.10
Enhanced degradation in polycrystalline silicon thin-film transistors under dynamic hot-carrier stressKow Ming Chang; Yuan Hung Chung; Gin Ming Lin; Chi Gun Deng; Jian Hong Lin20012001, vol.22, no.10
Experimental verification of the nature of the high energy tail in the electron energy distribution in n-channel MOSFETsK. G. Anil; S. Mahapatra; I. Eisele20012001, vol.22, no.10
Improving the RF performance of 0.18 μm CMOS with deep n-well implantationJiong-Guang Su; Heng-Ming Hsu; Shyh-Chyi Wong; Chun-Yen Chang; Tiao-Yuan Huang; Jack Yuan-Chen Sun20012001, vol.22, no.10
MOSFET drain/source charge partition under nonquasi-static switchingAllen F. -L. Ng; Wai-kit Lee; Ping K. Ko; Mansun Chan20012001, vol.22, no.10
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