期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2002, vol.18, no.1 2002, vol.18, no.2 2002, vol.18, no.3 2002, vol.18, no.4-5 2002, vol.18, no.6

题名作者出版年年卷期
Test generation for crosstalk-induced faults: framework and computational resultsWei-Yu Chen; Sandeep K. Gupta; Melvin A. Breuer20022002, vol.18, no.1
Fast hierarchical test path construction for circuits with DFT-free controller-datapath interfaceYiorgos Makris; Jamison Collins; Alex Orailoglu20022002, vol.18, no.1
An efficient deterministic test pattern generator for scan-based BIST environmentWei-Lun Wang; Kuen-Jong Lee20022002, vol.18, no.1
Sequential circuits with combinational test generation complexity under single-fault assumptionMichiko Inoue; Emil Gizdarski; Hideo Fujiwara20022002, vol.18, no.1
State and fault information for compaction-based test generationAshish Giani; Shuo Sheng; Michael S. Hsiao; Vishwani D. Agrawal20022002, vol.18, no.1
TA-PSV-timing analysis for partially specified vectorsLiang-Chi Chen; Sandeep K. Gupta; Melvin A. Breuer20022002, vol.18, no.1
Analysis of application of the IDDQ technique to the deep sub-micro VLSI testingChih-Wen Lu; Chung Len Lee; Chauchin Su; Jwu-E Chen20022002, vol.18, no.1



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