期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2013, vol.29, no.1 2013, vol.29, no.2 2013, vol.29, no.3 2013, vol.29, no.4 2013, vol.29, no.5 2013, vol.29, no.6

题名作者出版年年卷期
Preserving Hamming Distance in Arithmetic and Logical OperationsShlomi Dolev; Sergey Frenkel; Dan E. Tamir; Vladimir Sinelnikov20132013, vol.29, no.6
Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM TechniqueTian Xia; Rohit Shetty; Timothy Platt; Mustapha Slamani20132013, vol.29, no.6
Multi-bit Sigma-Delta TDC Architecture with Improved LinearitySatoshi Uemori; Masamichi Ishii; Haruo Kobayashi; Daiki Hirabayashi; Yuta Arakawa; Yuta Doi; Osamu Kobayashi; Tatsuji Matsuura; Kiichi Niitsu; Yuji Yano; Tatsuhiro Gake; Takahiro J. Yamaguchi; Nobukazu Takai20132013, vol.29, no.6
Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault ModelingLikun Xia; Muhammad Umer Farooq; Ian M. Bell; Fawnizu Azmadi Hussin; Aamir Saeed Malik20132013, vol.29, no.6
Efficient Test Compression Technique for SoC Based on Block Merging and Eight CodingTie-Bin Wu; Heng-Zhu Liu; Peng-Xia Liu20132013, vol.29, no.6
MoDiVHA: A Hierarchical Strategy for Distributed Test AssignmentJefferson P. Koppe; Elias P. Duarte, Jr.; Luis C. E. Bona20132013, vol.29, no.6
Selective SWIFT-R: A Flexible Software-Based Technique for Soft Error Mitigation in Low-Cost Embedded SystemsFelipe Restrepo-Calle; Antonio Martinez-Alvarez; Sergio Cuenca-Asensi; Antonio Jimeno-Morenilla20132013, vol.29, no.6
A Fault Tolerant Approach for FPGA Embedded Processors Based on Runtime Partial ReconfigurationAlexandros Vavousis; Andreas Apostolakis; Mihalis Psarakis20132013, vol.29, no.6
Effective Timing Error Tolerance in Flip-Flop Based Core DesignsStefanos Valadimas; Yiorgos Tsiatouhas; Angela Arapoyanni; Petros Xarchakos20132013, vol.29, no.6
Autonomous Fault-Tolerant Systems onto SRAM-based FPGA PlatformsCristiana Bolchini; Antonio Miele; Chiara Sandionigi20132013, vol.29, no.6
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