期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2000, vol.16, no.1-2 2000, vol.16, no.3 2000, vol.16, no.4 2000, vol.16, no.5 2000, vol.16, no.6

题名作者出版年年卷期
Logic design validation via simulation and automatic test pattern generationHussain Al-Asaad; John P. Hayes20002000, vol.16, no.6
Intermediacy prediction for high speed Berger code checkersCecilia Metra; Jien-Chung Lo20002000, vol.16, no.6
Catastrophic short and open fault detection in bipolar CML circuits: A case studyAndre Ivanov; Vikram Devdas20002000, vol.16, no.6
Bridging faults in pipelined circuitsM. Favalli; C. Metra20002000, vol.16, no.6
A new method for testing Re-programmable PLAsCharles E. Stroud; Jaems R. Bailey; John M. Emmert20002000, vol.16, no.6
A fault tolerant technique for FPAGsJohn M. Emmert; Dinesh K. Bhatia20002000, vol.16, no.6
Testing the local interconnect resources of SRAM-based FPGA'sM. Renovell; J. M. Portal; J. Figueras; Y. Zorian20002000, vol.16, no.5
Testing address decoder faults in two-port memories: fault models, tests, consequences of port restrictions, and test strategySaid Hamdioui; Ad J. Van De Goor20002000, vol.16, no.5
Test cycle count reduction in a parallel scan BIST environmentBechir Ayari; Prab Varma20002000, vol.16, no.5
Static test compaction for scan-based designs to reduce test application timeIrith Pomeranz; Sudhakar M. Reddy20002000, vol.16, no.5
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