期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2008, vol.24, no.1-3 2008, vol.24, no.4 2008, vol.24, no.5 2008, vol.24, no.6

题名作者出版年年卷期
Self-Testing Embedded Borden MJED Code Checkers for t = 2{sup}k q - 1 with q = 2{sup}m - 1Steffen Tarnick20082008, vol.24, no.6
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSRMyung-Hoon Yang; Yongjoon Kim; Sunghoon Chun; Sungho Kang20082008, vol.24, no.6
Online Testing of MEMS Based on Encoded Stimulus SuperpositionN. Dumas; Z. Xu; K. Georgopoulos; R. J. T. Bunyan; A. Richardson20082008, vol.24, no.6
Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating TechniqueSwarup Bhunia; Hamid Mahmoodi; Arijit Raychowdhury; Kaushik Roy20082008, vol.24, no.6
An Automotive CD-Player Electro-Mechanics Fault Simulation Using VHDL-AMSMariagrazia Graziano; Massimo Ruo Roch20082008, vol.24, no.6
Linearity Testing of A/D Converters Using Selective Code MeasurementShalabh Goyal; Abhijit Chatterjee20082008, vol.24, no.6
A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled LinesRoberto Gomez; Alejandro Giron; Victor H. Champac20082008, vol.24, no.6
A Reconfigurable Power Conscious Core Wrapper and its Application to System-on-Chip Test SchedulingErik Larsson; Zebo Peng20082008, vol.24, no.5
Controllability of Static CMOS Circuits for Timing CharacterizationRamyanshu Datta; Ravi Gupta; Antony Sebastine; Jacob A. Abraham; Manuel d'Abreu20082008, vol.24, no.5
Reverse Breakdown Voltage Measurement for Power P{sup}+NN{sup}+ RectifierGuangyu Huang; Cher Ming Tan20082008, vol.24, no.5
12345



制造业外文文献服务平台