期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024


题名作者出版年年卷期
Design and Verification of a SAR ADC SystemVerilog Real Number ModelGeorgoulopoulos, Nikolaos; Mamali, Theodora; Hatzopoulos, Alkis20242024, vol.40, no.3
Formal Verification of Universal Numbers using Theorem ProvingRashid, Adnan; Gauhar, Ayesha; Hasan, Osman; Abed, Sa'ed; Ahmad, Imtiaz20242024, vol.40, no.3
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial ApproachGoudet, Esther; Sureau, Fabio; Breuil, Paul; Pena Trevino, Luis; Naviner, Lirida; Daveau, Jean-Marc; Roche, Philippe20242024, vol.40, no.3
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative DecisionPan, Yuqi; Liang, Huaguo; Li, Junming; Qu, Jinxing; Huang, Zhengfeng; Yi, Maoxiang; Lu, Yingchun20242024, vol.40, no.3
A Novel Framework For Optimal Test Case Generation and Prioritization Using Ent-LSOA And IMTRNN TechniquesTamizharasi, A.; Ezhumalai, P.20242024, vol.40, no.3
Phase Noise Analysis Performance Improvement, Testing and Stabilization of Microwave Frequency SourceKumar, Vipin; Ghosh, Jayanta20242024, vol.40, no.3
Towards the Detection of Hardware Trojans with Cost Effective Test Vectors using Genetic AlgorithmChakraborty, Sandip; Ghosh, Archisman; Mondal, Anindan; Sen, Bibhash20242024, vol.40, no.3
The EditorialAgrawal, Vishwani D.20242024, vol.40, no.3
Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop ApplicationPattanaik, Manisha; Srivastava, Pankaj; Ahirwar, Rachana20242024, vol.40, no.2
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal TransmissionCao, Rongxing; Liu, Yan; Cai, Yulong; Mei, Bo; Zhao, Lin; Tian, Jiayu; Cui, Shuai; Lv, He; Zeng, Xianghua; Xue, Yuxiong20242024, vol.40, no.2
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