期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024 2025


题名作者出版年年卷期
The EditorialAgrawal, Vishwani D.Agrawal, Vishwani D.20252025, vol.41, no.1
2024 Reviewers 20252025, vol.41, no.1
Quantity Analysis Method for Text-Based Chip Test Datasets from Automated Test EquipmentFu, Jie; Sun, Kai; Jia, Hanbo; Fu, Da; Xu, Jingyuan; Guo, XuanFu, Jie; Sun, Kai; Jia, Hanbo; Fu, Da; Xu, Jingyuan; Guo, Xuan20252025, vol.41, no.1
SEU Fault Injection Strategy for SRAM-based FPGA User Memory Based on Dual-Circuit ModelLiu, Yuchao; Yao, Liang; Zhang, Wenjing; Wang, Yuhao; Jiang, Xinkai; Li, Fusen; Xu, QiuLiu, Yuchao; Yao, Liang; Zhang, Wenjing; Wang, Yuhao; Jiang, Xinkai; Li, Fusen; Xu, Qiu20252025, vol.41, no.1
Inherent Hardware Identifiers: Advancing IC Traceability and Provenance in the Multi-Die EraKhan, M. Shafkat M.; Xi, Chengjie; Varshney, Nitin; Bahk, Je-Hyeong; Asadizanjani, NavidKhan, M. Shafkat M.; Xi, Chengjie; Varshney, Nitin; Bahk, Je-Hyeong; Asadizanjani, Navid20252025, vol.41, no.1
Read & Write Stability of CNTFET 6T SRAM Cell: A Comprehensive AnalysisSharma, Vipin Kumar; Kumar, AbhishekSharma, Vipin Kumar; Kumar, Abhishek20252025, vol.41, no.1
Design and Simulation of a Dependable Architecture Using Triple Modular Redundancy for Embedded Cyber-Physical SystemsMahmood, Hamed A.; Khairullah, Shawkat S.Mahmood, Hamed A.; Khairullah, Shawkat S.20252025, vol.41, no.1
Design of a Low Noise Amplifier Based on Novel Monolayer Graphene FETKumawat, Arjun Lal; Pandey, Anukul; Raghava, N. S.Kumawat, Arjun Lal; Pandey, Anukul; Raghava, N. S.20252025, vol.41, no.1
Fault-Aware Test Case Prioritization in Software Testing Using Jaya Archimedes Optimization AlgorithmSugave, Shounak Rushikesh; Kulkarni, Yogesh R.; Jagdale, Balaso; Gutte, VitthalSugave, Shounak Rushikesh; Kulkarni, Yogesh R.; Jagdale, Balaso; Gutte, Vitthal20252025, vol.41, no.1
The EditorialAgrawal, Vishwani D.Agrawal, Vishwani D.20242024, vol.40, no.6
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