期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2002, vol.18, no.1 2002, vol.18, no.2 2002, vol.18, no.3 2002, vol.18, no.4-5 2002, vol.18, no.6

题名作者出版年年卷期
A built-in self-test scheme with diagnostics support for embedded SRAMChih-Wea Wang; Chi-Feng Wu; Jin-Fu Li; Cheng-Wen Wu; Tony Teng; Kevin Chiu; Hsiao-Ping Lin20022002, vol.18, no.6
An interleaving technique for reducing peak power in multiple-chain scan circuits during test applicationKuen-Jong Lee; Tsung-Chu Huang20022002, vol.18, no.6
Partial scan testing on the register-transfer levelBruce S. Greene; Samiha Mourad20022002, vol.18, no.6
Behavioral-level DFT via formal operator testability measuresSandhya Seshadri; Michael S. Hsiao20022002, vol.18, no.6
Fast-anti-random (FAR) test generation to improve the quality of behavioral model verificationTom Chen; Andre Bai; Amjad Hajjar; Anneliese K. Amschler Andrews; C. Anderson20022002, vol.18, no.6
Structural fault based specification reduction for testing analog circuitsSoony-Jyh Chang; Chung Len Lee; Jwu E. Chen20022002, vol.18, no.6
On-chip clock faults' detectorC. Metra; M. Favalli; S. Di Francescantonio; B. Ricco20022002, vol.18, no.4-5
Signal integrity: fault modeling and testing in high-speed SoCsMehrdad Nourani; Amir Attarha20022002, vol.18, no.4-5
Testing for interconnect crosstalk defects using on-chip embedded processor coresLi Chen; Xiaoliang Bai; Sujit Dey20022002, vol.18, no.4-5
Diagnostic data compression techniques for embedded memories with built-in self-testJinn-Fu Li Ruey-Shing Tzeng; Cheng-Wen Wu20022002, vol.18, no.4-5
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