期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2010, vol.26, no.1 2010, vol.26, no.2 2010, vol.26, no.3 2010, vol.26, no.4 2010, vol.26, no.5 2010, vol.26, no.6

题名作者出版年年卷期
A Framework for Automated Detection of Power-related Software Errors in Industrial Verification ProcessesStefano Gandini; Walter Ruzzarin; Ernesto Sanchez; Giovanni Squillero; Alberto Tonda20102010, vol.26, no.6
Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area OverheadUsha Sandeep Mehta; Kankar S. Dasgupta; Nirnjan M. Devashrayee20102010, vol.26, no.6
Chiba Scan Delay Fault Testing with Short Test Application TimeKazuteru Namba; Hideo Ito20102010, vol.26, no.6
Study of Read Recovery Dynamic Faults in 6T SRAMS and Method to Improve Test TimePrashant Dubey; Akhil Garg; Shashank Mahajan20102010, vol.26, no.6
Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test ArchitectureJari Hannu; Teuvo Saikkonen; Juha Hakkinen; Juha Karttunen; Markku Moilanen20102010, vol.26, no.6
An Effective and Accurate Methodology for the Cell Internal Defect DiagnosisAymen Ladhar; Mohamed Masmoudi20102010, vol.26, no.6
On-Chip Delay Measurement Based Response Analysis for Timing CharacterizationRamyanshu Datta; Antony Sebastine; Ashwin Raghunathan; Gary Carpenter; Kevin Nowka; Jacob A. Abraham20102010, vol.26, no.6
Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test PatternsAhmad A. Al-Yamani; Edward J. McCluskey20102010, vol.26, no.5
JTAG Security System Based on CredentialsKeunyoung Park; Sang Guun Yoo; Taejun Kim; Juho Kim20102010, vol.26, no.5
Classification of Activated Faults in the FlexRay-Based NetworksYasser Sedaghat; Seyed Ghassem Miremadi20102010, vol.26, no.5
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