期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2020, vol.36, no.1 2020, vol.36, no.2 2020, vol.36, no.3 2020, vol.36, no.4 2020, vol.36, no.5 2020, vol.36, no.6

题名作者出版年年卷期
Low-Cost Error Detection in Deep Neural Network Accelerators with Linear Algorithmic ChecksumsOzen, Elbruz; Orailoglu, Alex20202020, vol.36, no.6
EditorialAgrawal, Vishwani D.20202020, vol.36, no.6
Detection and Diagnosis of Multi-Fault for through Silicon Vias in 3D ICZeng, Lizhen; Shang, Yuling; Tan, Weipeng; Li, Chunquan; Fan, Haihua20202020, vol.36, no.6
Diagnosis and Compensation of Control Program, Sensor and Actuator Failures in Nonlinear Systems Using Hierarchical State Space ChecksMomtaz, Md Imran; Chatterjee, Abhijit20202020, vol.36, no.6
A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal CircuitsSanyal, Sayandeep; Bhattacharya, Mayukh; Patra, Amit; Dasgupta, Pallab20202020, vol.36, no.6
Efficient Designs of Reversible Majority VotersKheirandish, Davar; Haghparast, Majid; Reshadi, Midia; Hosseinzadeh, Mehdi20202020, vol.36, no.6
Proton Beam Validation of a New Single Event Transient Mitigation TechniqueSmith, Farouk20202020, vol.36, no.6
Identification of Logic Paths Influenced by Severe Coupling CapacitancesMeza-Ibarra, I. D.; Champac, V; Gomez-Fuentes, R.; Noriega, J. R.; Vera-Marquina, A.20202020, vol.36, no.6
Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAsGokalan, Akin; Tosun, Suleyman; Dal, Deniz20202020, vol.36, no.6
EditorialAgrawal, Vishwani D.20202020, vol.36, no.5
1234567



制造业外文文献服务平台