期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2021, vol.37, no.1 2021, vol.37, no.2 2021, vol.37, no.3 2021, vol.37, no.4 2021, vol.37, no.5/6

题名作者出版年年卷期
TTTC Newsletter 20212021, vol.37, no.5/6
Analysis of Security Vulnerability Levels of In-Vehicle Network Topologies Applying Graph RepresentationsPetho Zsombor; Khan Intiyaz; Torok árpád20212021, vol.37, no.5/6
A Framework for Configurable Joint-Scan Design-for-Test ArchitectureTudu Jaynarayan T.; Ahlawat Satyadev; Shukla Sonali; Singh Virendra20212021, vol.37, no.5/6
On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd OptimizationJayabalan Muralidharan; Srinivas E.; Shajin Francis H.; Rajesh P.20212021, vol.37, no.5/6
A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic AlgorithmYang Xiaoyan; Yang Chenglin; Wang Houjun20212021, vol.37, no.5/6
Retesting Defective Circuits to Allow Acceptable Faults for Yield EnhancementJena Sisir Kumar; Biswas Santosh; Deka Jatindra Kumar20212021, vol.37, no.5/6
Stress-Aware Periodic Test of InterconnectsSadeghi-Kohan Somayeh; Hellebrand Sybille; Wunderlich Hans-Joachim20212021, vol.37, no.5/6
Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilogGeorgoulopoulos Nikolaos; Hatzopoulos Alkiviadis20212021, vol.37, no.5/6
2020 JETTA-TTTC Best Paper Award 20212021, vol.37, no.5/6
EditorialAgrawal Vishwani D.20212021, vol.37, no.5/6
123456



制造业外文文献服务平台