期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2003, vol.19, no.1 2003, vol.19, no.2 2003, vol.19, no.3 2003, vol.19, no.4 2003, vol.19, no.5 2003, vol.19, no.6

题名作者出版年年卷期
Primitive Polynomials Over GF(2) of Degree up to 660 with Uniformly Distributed CoefficientsJANUSZ RAJSKI; JERZY TYSZER; K. K. Saluja20032003, vol.19, no.6
A Low Power Pseudo-Random BIST TechniqueNADIR Z. BASTURKMEN; SUDHAKAR M. REDDY; IRITH POMERANZ; M. Abramovici20032003, vol.19, no.6
On Faster I{Sub}(DDQ) MeasurementsC. THIBEAULT; R. Makki20032003, vol.19, no.6
Defect Diagnosis Using a Current Ratio Based Quiescent Signal Analysis Model for Commercial Power GridsChintan Patel; Ernesto Staroswiecki; Smita Pa War; Dhruva Acharyya; Jim Plusquellic; Editor: R. Makki20032003, vol.19, no.6
A BICS for CMOS OpAmps by Monitoring the Supply Current PeakJ. Font; J. Ginard; R. Picos; E. Isern; J. Segura; M. Roca And E. Garcia20032003, vol.19, no.5
A Statistical Sampler for a New On-Line Analog Test MethodMarcelo Negreiros; Luigi Carro; Altamiro A. Susin20032003, vol.19, no.5
Accurate Analysis of Single Event Upsets in a Pipelined MicroprocessorM. Rebaudengo; M. Sonza Reorda; M. Violante20032003, vol.19, no.5
Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and ExperimentsR. Leveugle; K. Hadjiat20032003, vol.19, no.5
BIST-Based Delay-Fault Testing in FPGAsMiron Abramovici; Charles E. Stroud20032003, vol.19, no.5
On-Line Monitor Design of Finite-State MachinesFeng Gao; John P. Hayes20032003, vol.19, no.5
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