期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2012, vol.28, no.1 2012, vol.28, no.2 2012, vol.28, no.3 2012, vol.28, no.4 2012, vol.28, no.5 2012, vol.28, no.6

题名作者出版年年卷期
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC ConverterY. Ren; L. Fan; L. Chen; S. J. Wen; R. Wong; N. W. van Vonno; A. F. Witulski; B. L. Bhuva20122012, vol.28, no.6
Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLABKanad Chakraborty; Vishwani D. Agrawal20122012, vol.28, no.6
Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI WearoutJ. M. Ruiz; R. Fernandez-Garcia; I. Gil; M. Morata20122012, vol.28, no.6
Current State of the Mixed-Signal Test Bus 1149.4Jari Hannu; Juha Hakkinen; Juha-Veikko Voutilainen; Heli Jantunen; Markku Moilanen20122012, vol.28, no.6
A Non-Enumerative Technique for Measuring Path Correlation in Digital CircuitsStelios N. Neophytou; Kyriakos Christou; Maria K. Michael20122012, vol.28, no.6
Structural Test and Diagnosis for Graceful Degradation of NoC SwitchesAtefe Dalirsani; Stefan Holst; Melanie Elm; Hans-Joachim Wunderlich20122012, vol.28, no.6
K~(th)-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and DiagnosisVladimir Pasca; Lorena Anghel; Mounir Benabdenbi20122012, vol.28, no.6
A Test Platform for Dependability Analysis of SoCs Exposed to EMI and RadiationJuliano Benfica; Leticia Maria Bolzani Poehls; Fabian Vargas; Jose Lipovetzky; Ariel Lutenberg; Edmundo Gatti; Fernando Hernandez20122012, vol.28, no.6
Prediction of Long-term Immunity of a Phase-Locked LoopA. Boyer; S. Ben Dhia; B. Li; C. Lemoine; B. Vrignon20122012, vol.28, no.6
Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection ApproachM. Portela-Garcia; A. Lindoso; L. Entrena; M. Garcia-Valderas; C. Lopez-Ongil; N. Marroni; B. Pianta; L. Bolzani Poehls; F. Vargas20122012, vol.28, no.6
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