期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2002, vol.18, no.1 2002, vol.18, no.2 2002, vol.18, no.3 2002, vol.18, no.4-5 2002, vol.18, no.6

题名作者出版年年卷期
Behavior analysis of internal feedback bridging faults in CMOS circuitsYukiya Miura; Shuichi Seno20022002, vol.18, no.2
Digital window comparator DfT scheme for mixed-signal ICsDaniela De Venuto; Michael J. Ohletz; Bruno Ricco20022002, vol.18, no.2
Enhanced reduced pin-count test for full-scan designHarald Vranken; Tom Waayers; Herve Fleury; David Lelouvier20022002, vol.18, no.2
Hardware generation of random single input change test sequencesR. David; P. Girard; C. Landrault; S. Pravossoudovitch; A. Virazel20022002, vol.18, no.2
Two-dimensional test data compression for scan-based deterministic BISTHua-Guo Liang; Sybille Hellebrand; Hans-Joachim Wunderlich20022002, vol.18, no.2
Using at-speed BIST to test LVDS serializer/deserializer functionMagnus Eckersand; Fredrik Franzon; Ken Filliter20022002, vol.18, no.2
RTL design validation, DFT and test pattern generation for high defects coverageM. B. Santos; F. M. Goncalves; I. C. Teixeira; J. P. Teixeira20022002, vol.18, no.2
Synthesis of scan chains for netlist descriptions at RT-levelYu Huang; Chien-Chung Tsai; Nilanjan Mukherjee; Omer Samman; Wu-Tung Cheng; Sudhakar M. Reddy20022002, vol.18, no.2
An implementation for test-time reduction in VLIW transport-triggered architecturesV. A. Zivkovic; R. J. W. T. Tangelder; H. G. Kerkhoff20022002, vol.18, no.2
Test wrapper and test access mechanism co-optimization for system-on-chipVikram Iyengar; Krishnendu Chakrabarty; Erik Jan Marinissen20022002, vol.18, no.2
12



制造业外文文献服务平台