期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2002, vol.18, no.1 2002, vol.18, no.2 2002, vol.18, no.3 2002, vol.18, no.4-5 2002, vol.18, no.6

题名作者出版年年卷期
On IEEE P1500's standard for embedded core testErik Jan Marinissen; Rohit Kapur; Maurice Lousberg; Teresa McLaurin; Mike Ricchetti; Yervant Zorian20022002, vol.18, no.4-5
An integrated framework for the design and optimization of SOC test solutionsErik Larsson; Zebo Peng20022002, vol.18, no.4-5
On concurrent test of core-based SOC designYu Huang; Wu-Tung Cheng; Chien-Chung Tsai; Nilanjan Mukherjee; Omer Samman; Yahya Zaidan; Sudhakar M. Reddy20022002, vol.18, no.4-5
A novel reconfigurable wrapper for testing of embedded core-based SOCs and its associated scheduling algorithmSandeep Kopanne20022002, vol.18, no.4-5
The role of test protocols in automated test generation for embedded-core-based system ICsErik Jan Marinissen20022002, vol.18, no.4-5
CAS-BUS: a test access mechanism and a toolbox environment for core-based system chip testingMounir Benabdenbi; Walid Maroufi; Meryem Marzouki20022002, vol.18, no.4-5
An integrated approach to testing embedded cores and interconnects using test access mechanism (TAM) switchSubhayu Basu; Sudipta Bhawmik20022002, vol.18, no.4-5
Design for consecutive testability of system-on-a-chip with built-in self testable coresTomokazu Yoneda; Hideo Fujiwara20022002, vol.18, no.4-5
Deterministic test vector compression/decompression for systems-on-a-chip using an embedded processorAbhijit Jas; Nur A. Touba20022002, vol.18, no.4-5
Diagnostic data compression techniques for embedded memories with built-in self-testJinn-Fu Li Ruey-Shing Tzeng; Cheng-Wen Wu20022002, vol.18, no.4-5
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